TY - JOUR
T1 - W-DOE: Wasserstein Distribution-Agnostic Outlier Exposure
AU - Wang, Qizhou
AU - Han, Bo
AU - Liu, Yang
AU - Gong, Chen
AU - Liu, Tongliang
AU - Liu, Jiming
N1 - Funding Information:
The work of Qizhou Wang and Bo Han were supported in part by the NSFC General Program under Grant 62376235, in part by RGC Young Collaborative Research under Grant C2005-24Y, in part by Guangdong Basic and Applied Basic Research Foundation under Grant 2022A1515011652 and Grant 2024A1515012399, in part by HKBU Faculty Niche Research Areas under Grant RC-FNRA-IG/22-23/SCI/04, and in part by HKBU CSD Departmental Incentive Scheme. The work of Chen Gong was supported in part by the NSF of China under Grant 62336003 and Grant 12371510, and in part by the NSF for Distinguished Young Scholar of Jiangsu Province under Grant BK20220080. Recommended for acceptance by R. Cucchiara.
Publisher copyright:
© 2025 The Authors.
PY - 2025/5
Y1 - 2025/5
N2 - In open-world environments, classification models should be adept at identifying out-of-distribution (OOD) data whose semantics differ from in-distribution (ID) data, leading to the emerging research in OOD detection. As a promising learning scheme, outlier exposure (OE) enables the models to learn from auxiliary OOD data, enhancing model representations in discerning between ID and OOD patterns. However, these auxiliary OOD data often do not fully represent real OOD scenarios, potentially biasing our models in practical OOD detection. Hence, we propose a novel OE-based learning method termed Wasserstein Distribution-agnostic Outlier Exposure (W-DOE), which is both theoretically sound and experimentally superior to previous works. The intuition is that by expanding the coverage of training-time OOD data, the models will encounter fewer unseen OOD cases upon deployment. In W-DOE, we achieve additional OOD data to enlarge the OOD coverage, based on a new data synthesis approach called implicit data synthesis (IDS). It is driven by our new insight that perturbing model parameters can lead to implicit data transformation, which is simple to implement yet effective to realize. Furthermore, we suggest a general learning framework to search for the synthesized OOD data that can benefit the models most, ensuring the OOD performance for the enlarged OOD coverage measured by the Wasserstein metric. Our approach comes with provable guarantees for open-world settings, demonstrating that broader OOD coverage ensures reduced estimation errors and thereby improved generalization for real OOD cases. We conduct extensive experiments across a series of representative OOD detection setups, further validating the superiority of W-DOE against state-of-the-art counterparts in the field.
AB - In open-world environments, classification models should be adept at identifying out-of-distribution (OOD) data whose semantics differ from in-distribution (ID) data, leading to the emerging research in OOD detection. As a promising learning scheme, outlier exposure (OE) enables the models to learn from auxiliary OOD data, enhancing model representations in discerning between ID and OOD patterns. However, these auxiliary OOD data often do not fully represent real OOD scenarios, potentially biasing our models in practical OOD detection. Hence, we propose a novel OE-based learning method termed Wasserstein Distribution-agnostic Outlier Exposure (W-DOE), which is both theoretically sound and experimentally superior to previous works. The intuition is that by expanding the coverage of training-time OOD data, the models will encounter fewer unseen OOD cases upon deployment. In W-DOE, we achieve additional OOD data to enlarge the OOD coverage, based on a new data synthesis approach called implicit data synthesis (IDS). It is driven by our new insight that perturbing model parameters can lead to implicit data transformation, which is simple to implement yet effective to realize. Furthermore, we suggest a general learning framework to search for the synthesized OOD data that can benefit the models most, ensuring the OOD performance for the enlarged OOD coverage measured by the Wasserstein metric. Our approach comes with provable guarantees for open-world settings, demonstrating that broader OOD coverage ensures reduced estimation errors and thereby improved generalization for real OOD cases. We conduct extensive experiments across a series of representative OOD detection setups, further validating the superiority of W-DOE against state-of-the-art counterparts in the field.
KW - Data models
KW - Learning systems
KW - Machine learning
KW - Open-set Learning
KW - Out-of-distribution Detection
KW - Perturbation methods
KW - Predictive models
KW - Random variables
KW - Reliability
KW - Reliable Machine Learning
KW - Semantics
KW - Systematics
KW - Training
KW - Out-of-distribution detection
KW - open-set learning
KW - reliable machine learning
UR - http://www.scopus.com/inward/record.url?scp=105003041078&partnerID=8YFLogxK
U2 - 10.1109/TPAMI.2025.3531000
DO - 10.1109/TPAMI.2025.3531000
M3 - Journal article
C2 - 40031218
SN - 0162-8828
VL - 47
SP - 3530
EP - 3545
JO - IEEE Transactions on Pattern Analysis and Machine Intelligence
JF - IEEE Transactions on Pattern Analysis and Machine Intelligence
IS - 5
ER -