TY - JOUR
T1 - VUV laser-induced plasma emissions for ultra-micro spectrochemical analysis of liquid samples
AU - Cheung, Nai Ho
AU - Ng, C. W.
AU - Ho, W. F.
AU - Yeung, Edward S.
N1 - Copyright:
Copyright 2004 Elsevier Science B.V., Amsterdam. All rights reserved.
PY - 1997
Y1 - 1997
N2 - The specific case of pulsed-laser ablation of liquid samples were studied and the production mechanism of the plasma emissions aimed to reduce their interfering effects. Aqueous solutions seeded with various metal salts as test analysis were ablated with laser pulses of 532-nm, 248-nm, and 193-nm wavelengths. Time and space resolved spectra of the plume emissions were analyzed to yield estimates of plasma temperature and electron density. With 532-nm ablation, the plasma produced was hot and extensively ionized, with electron density in the 1018 cm-3 range. 193-nm laser ablation at similar fluence generated plasmas of much lower temperature but comparable electron density.
AB - The specific case of pulsed-laser ablation of liquid samples were studied and the production mechanism of the plasma emissions aimed to reduce their interfering effects. Aqueous solutions seeded with various metal salts as test analysis were ablated with laser pulses of 532-nm, 248-nm, and 193-nm wavelengths. Time and space resolved spectra of the plume emissions were analyzed to yield estimates of plasma temperature and electron density. With 532-nm ablation, the plasma produced was hot and extensively ionized, with electron density in the 1018 cm-3 range. 193-nm laser ablation at similar fluence generated plasmas of much lower temperature but comparable electron density.
UR - http://www.scopus.com/inward/record.url?scp=0030671692&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:0030671692
SN - 1092-8081
VL - 11
SP - 185
EP - 186
JO - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
JF - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
T2 - Proceedings of the 1997 Conference on Lasers and Electro-Optics, CLEO
Y2 - 18 May 1997 through 23 May 1997
ER -