Abstract
The issue of uniformity is crucial in quasi-Monte Carlo methods and in the design of computer experiments. In this paper we study the role of uniformity in fractional factorial designs. For fractions of two- or three-level factorials, we derive results connecting orthogonality, aberration and uniformity and show that these criteria agree quite well. This provides further justification for the criteria of orthogonality or minimum aberration in terms of uniformity. Our results refer to several natural measures of uniformity and we consider both regular and nonregular fractions. The theory developed here has the potential of significantly reducing the complexity of computation for searching for minimum aberration designs.
Original language | English |
---|---|
Title of host publication | Monte Carlo and Quasi-Monte Carlo Methods 2000 |
Subtitle of host publication | Proceedings of a Conference held at Hong Kong Baptist University, Hong Kong SAR, China, November 27 – December 1, 2000 |
Editors | Kai Tai Fang, Harald Niederreiter, Fred J. Hickernell |
Publisher | Springer Berlin Heidelberg |
Pages | 232–241 |
Number of pages | 10 |
Edition | 1st |
ISBN (Electronic) | 9783642560460 |
ISBN (Print) | 9783540427186 |
DOIs | |
Publication status | Published - 22 Jan 2002 |
Externally published | Yes |
Event | 4th International Conference on Monte Carlo and Quasi-Monte Carlo Methods in Scientific Computing, MCMQC 2000 - Hong Kong Baptist University, Hong Kong Duration: 27 Nov 2000 → 1 Dec 2000 https://www.math.hkbu.edu.hk/mcqmc/MCQMC2000.html (Link to conference website) https://link.springer.com/book/10.1007/978-3-642-56046-0 (Link to conference proceedings) |
Conference
Conference | 4th International Conference on Monte Carlo and Quasi-Monte Carlo Methods in Scientific Computing, MCMQC 2000 |
---|---|
Country/Territory | Hong Kong |
Period | 27/11/00 → 1/12/00 |
Internet address |
|
User-Defined Keywords
- Orthogonal Array
- Prime Power
- Fractional Factorial Design
- Minimum Aberration
- Projection Uniformity