Uniformity in Fractional Factorials

Kai Tai Fang, Chang Xing Ma, Rahul Mukerjee

Research output: Chapter in book/report/conference proceedingConference proceeding

Abstract

The issue of uniformity is crucial in quasi-Monte Carlo methods and in the design of computer experiments. In this paper we study the role of uniformity in fractional factorial designs. For fractions of two- or three-level factorials, we derive results connecting orthogonality, aberration and uniformity and show that these criteria agree quite well. This provides further justification for the criteria of orthogonality or minimum aberration in terms of uniformity. Our results refer to several natural measures of uniformity and we consider both regular and nonregular fractions. The theory developed here has the potential of significantly reducing the complexity of computation for searching for minimum aberration designs.
Original languageEnglish
Title of host publicationMonte Carlo and Quasi-Monte Carlo Methods 2000
Subtitle of host publicationProceedings of a Conference held at Hong Kong Baptist University, Hong Kong SAR, China, November 27 – December 1, 2000
EditorsKai Tai Fang, Harald Niederreiter, Fred J. Hickernell
PublisherSpringer Berlin Heidelberg
Pages232–241
Number of pages10
Edition1st
ISBN (Electronic)9783642560460
ISBN (Print)9783540427186
DOIs
Publication statusPublished - 22 Jan 2002
Externally publishedYes
Event4th International Conference on Monte Carlo and Quasi-Monte Carlo Methods in Scientific Computing, MCMQC 2000 - Hong Kong Baptist University, Hong Kong
Duration: 27 Nov 20001 Dec 2000
https://www.math.hkbu.edu.hk/mcqmc/MCQMC2000.html (Link to conference website)
https://link.springer.com/book/10.1007/978-3-642-56046-0 (Link to conference proceedings)

Conference

Conference4th International Conference on Monte Carlo and Quasi-Monte Carlo Methods in Scientific Computing, MCMQC 2000
Country/TerritoryHong Kong
Period27/11/001/12/00
Internet address

User-Defined Keywords

  • Orthogonal Array
  • Prime Power
  • Fractional Factorial Design
  • Minimum Aberration
  • Projection Uniformity

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