Trustworthiness assessment for industrial IoT as multilayer networks with von Neumann entropy

Xing Wu, Jianjia Wang, Peng Wang, Zhaoxiang Bian, Tao Huang, Yike Guo, Hamido Fujita*

*Corresponding author for this work

Research output: Contribution to journalJournal articlepeer-review

3 Citations (Scopus)

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Engineering & Materials Science