Transmittance and resistivity of semicontinuous copper films prepared by pulsed-laser deposition

S. K. So; H. H. Fong; C. F. Yeung; N. H. Cheung

doi:10.1063/1.1289259

Transmittance and resistivity of semicontinuous copper films prepared by pulsed-laser deposition

S. K. So, H. H. Fong, C. F. Yeung, N. H. Cheung^*

^*Corresponding author for this work

Department of Physics

Research output: Contribution to journal › Journal article › peer-review

15 Citations (Scopus)

Abstract

Thin copper films were grown on glass by pulsed-laser deposition. The simultaneous in situ monitoring of the electrical resistance and optical transmittance of the growing film yielded highly reproducible and consistent data about percolation onset and film conductivity, both being useful indicators of film quality. When prepared under favorable conditions, films as thin as 1.5 nm would percolate, and became fully continuous at 5 nm, with conductivity reaching 30% of that of bulk copper.

Original language	English
Pages (from-to)	1099-1101
Number of pages	3
Journal	Applied Physics Letters
Volume	77
Issue number	8
DOIs	https://doi.org/10.1063/1.1289259
Publication status	Published - 21 Aug 2000

Scopus Subject Areas

Physics and Astronomy (miscellaneous)

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abstract = "Thin copper films were grown on glass by pulsed-laser deposition. The simultaneous in situ monitoring of the electrical resistance and optical transmittance of the growing film yielded highly reproducible and consistent data about percolation onset and film conductivity, both being useful indicators of film quality. When prepared under favorable conditions, films as thin as 1.5 nm would percolate, and became fully continuous at 5 nm, with conductivity reaching 30% of that of bulk copper.",

author = "So, {S. K.} and Fong, {H. H.} and Yeung, {C. F.} and Cheung, {N. H.}",

note = "This work was supported by a Faculty Research Grant of the Hong Kong Baptist University. ",

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AU - Fong, H. H.

AU - Yeung, C. F.

AU - Cheung, N. H.

N1 - This work was supported by a Faculty Research Grant of the Hong Kong Baptist University.

PY - 2000/8/21

Y1 - 2000/8/21

N2 - Thin copper films were grown on glass by pulsed-laser deposition. The simultaneous in situ monitoring of the electrical resistance and optical transmittance of the growing film yielded highly reproducible and consistent data about percolation onset and film conductivity, both being useful indicators of film quality. When prepared under favorable conditions, films as thin as 1.5 nm would percolate, and became fully continuous at 5 nm, with conductivity reaching 30% of that of bulk copper.

AB - Thin copper films were grown on glass by pulsed-laser deposition. The simultaneous in situ monitoring of the electrical resistance and optical transmittance of the growing film yielded highly reproducible and consistent data about percolation onset and film conductivity, both being useful indicators of film quality. When prepared under favorable conditions, films as thin as 1.5 nm would percolate, and became fully continuous at 5 nm, with conductivity reaching 30% of that of bulk copper.

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U2 - 10.1063/1.1289259

DO - 10.1063/1.1289259

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Transmittance and resistivity of semicontinuous copper films prepared by pulsed-laser deposition

Abstract

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