Abstract
In the present study, model organic light-emitting diodes (OLEDs) with a structure of Ag/tris(8-hydroxyquinoline) aluminum (Alq3)/indium tin oxide (ITO) were fabricated using vacuum evaporation and analyzed using an x-ray photoelectron spectroscopy (XPS) depth profile technique. Diffusion of Ag into the Alq3 layer was clearly observed. Applying a positive electron field enhanced the diffusion. Compared with pure Ag, the binding energy of diffused Ag 3d5/2 at the interface increased slightly, and the contribution of Ag to the valence-band spectra also was changed across the depth, implying a weak interaction between diffused Ag and the hydroxyquinoline ligands.
| Original language | English |
|---|---|
| Pages (from-to) | 70-73 |
| Number of pages | 4 |
| Journal | Surface and Interface Analysis |
| Volume | 32 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - Aug 2001 |
User-Defined Keywords
- Ag
- Alq
- Interracial lnteraction
- XPS depth profile