Study on the interaction between Ag and tris(8-hydroxyquinoline) aluminum using x-ray photoelectron spectroscopy

Weijie Song, Shu Kong SO, John Moulder, Yong Qiu, Yongfa Zhu, Lili Cao*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)

Abstract

In the present study, model organic light-emitting diodes (OLEDs) with a structure of Ag/tris(8-hydroxyquinoline) aluminum (Alq3)/indium tin oxide (ITO) were fabricated using vacuum evaporation and analyzed using an x-ray photoelectron spectroscopy (XPS) depth profile technique. Diffusion of Ag into the Alq3 layer was clearly observed. Applying a positive electron field enhanced the diffusion. Compared with pure Ag, the binding energy of diffused Ag 3d5/2 at the interface increased slightly, and the contribution of Ag to the valence-band spectra also was changed across the depth, implying a weak interaction between diffused Ag and the hydroxyquinoline ligands.

Original languageEnglish
Pages (from-to)70-73
Number of pages4
JournalSurface and Interface Analysis
Volume32
Issue number1
DOIs
Publication statusPublished - Aug 2001

Scopus Subject Areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

User-Defined Keywords

  • Ag
  • Alq
  • Interracial lnteraction
  • XPS depth profile

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