Study of lithium fluoride/tris(8-hydroxyquinolino)-aluminum interfacial chemistry using XPS and ToF-SIMS

Weijie Song*, Shu Kong SO, K. W. Wong, W. K. Choi, Lili Cao

*Corresponding author for this work

Research output: Contribution to journalJournal articlepeer-review

18 Citations (Scopus)

Abstract

The insertion of a thin LiF layer between Al and tris(8-hydroxyquinolino)- aluminum (Alq 3 ) is a significant advance in the practical development of organic light-emitting devices (OLEDs). We studied the chemistry at the buried interface of LiF/Alq 3 using X-ray photoelectron spectroscopy (XPS) and time of flight secondary ion mass spectrometry (ToF-SIMS). Dramatic changes in Al 2p, N 1s, and O 1s line shapes were observed after LiF deposition. These changes were attributed to the partial substitution of hydroxyquinoline ligands of Alq 3 by F - , and the formation of hydroxyquinoline anions at the LiF/Alq 3 interface. The AlqF + structure of products was confirmed by ToF-SIMS.

Original languageEnglish
Pages (from-to)373-377
Number of pages5
JournalApplied Surface Science
Volume228
Issue number1-4
DOIs
Publication statusPublished - 30 Apr 2004

Scopus Subject Areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

User-Defined Keywords

  • Alq
  • Interfacial reaction
  • Organic light-emittng devices

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