Abstract
The insertion of a thin LiF layer between Al and tris(8-hydroxyquinolino)- aluminum (Alq 3 ) is a significant advance in the practical development of organic light-emitting devices (OLEDs). We studied the chemistry at the buried interface of LiF/Alq 3 using X-ray photoelectron spectroscopy (XPS) and time of flight secondary ion mass spectrometry (ToF-SIMS). Dramatic changes in Al 2p, N 1s, and O 1s line shapes were observed after LiF deposition. These changes were attributed to the partial substitution of hydroxyquinoline ligands of Alq 3 by F - , and the formation of hydroxyquinoline anions at the LiF/Alq 3 interface. The AlqF + structure of products was confirmed by ToF-SIMS.
Original language | English |
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Pages (from-to) | 373-377 |
Number of pages | 5 |
Journal | Applied Surface Science |
Volume | 228 |
Issue number | 1-4 |
DOIs | |
Publication status | Published - 30 Apr 2004 |
Scopus Subject Areas
- Chemistry(all)
- Condensed Matter Physics
- Physics and Astronomy(all)
- Surfaces and Interfaces
- Surfaces, Coatings and Films
User-Defined Keywords
- Alq
- Interfacial reaction
- Organic light-emittng devices