Spatial point pattern analysis by using Voronoi diagrams and Delaunay tessellations - A comparative study

Sung Nok CHIU*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

Given a spatial point pattern, we use various characteristics of its Voronoi diagram and Delaunay tessellation to extract information of the dependence between points. In particular, we use the characteristics to construct statistics for testing complete spatial randomness. It is shown that the minimum angle of a typical Delaunay triangle is sensitive to both regularity and clustering alternatives, whilst the triangle's area or perimeter is more sensitive to clustering than regularity. These statistics are also sensitive to the Baddeley-Silverman cell process.

Original languageEnglish
Pages (from-to)367-376
Number of pages10
JournalBiometrical Journal
Volume45
Issue number3
DOIs
Publication statusPublished - 2003

Scopus Subject Areas

  • Statistics and Probability
  • Statistics, Probability and Uncertainty

User-Defined Keywords

  • Complete spatial randomness
  • Delaunay tessellation
  • Goodness of fit
  • Spatial point pattern
  • Voronoi diagram

Fingerprint

Dive into the research topics of 'Spatial point pattern analysis by using Voronoi diagrams and Delaunay tessellations - A comparative study'. Together they form a unique fingerprint.

Cite this