Abstract
With the widespread use of industrial computed tomography (CT) in semiconductor manufacturing, the noise in tomographic images from low-power radiation sources has become an increasingly prominent issue, which severely impacts the detection and processing tasks. In this paper, a spatial-frequency image noise suppression model (SFNS) is proposed to suppress noise while maintaining structural details in the image. A hybrid loss with spatial-frequency dual-domain information is designed to resolve spatial-domain limitations in optimization through complex-discrepancy-based spherical region separation criterion. To address the coupled noise characteristics in low-power CT systems, a stochastic noise degradation training strategy is designed to dynamically emulate fluctuations in real noise environments, and the network architecture integrates checkerboard sampling with cascaded residual stacks to enhance detail perception and reduce computational overhead. Experimental results demonstrate that SFNS achieves PSNR 32.14dB and SSIM 0.8896. Both quantitative metrics and qualitative evaluations validate the effectiveness of the proposed method in balancing structural fidelity and noise suppression.
| Original language | English |
|---|---|
| Article number | 807 |
| Number of pages | 15 |
| Journal | Applied Intelligence |
| Volume | 55 |
| Issue number | 11 |
| Early online date | 20 Jun 2025 |
| DOIs | |
| Publication status | Published - Jul 2025 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 9 Industry, Innovation, and Infrastructure
User-Defined Keywords
- Deep learning
- Industrial computed tomography
- Low-power
- Noise suppression
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