Room-temperature visible electroluminescence from aluminum nitride thin film embedded with aluminum nanocrystals

Ming Yang*, T. P. Chen, Yang Liu, Liang Ding, Jen It Wong, Zhen Liu, Sam Zhang, Wali Zhang, Furong Zhu

*Corresponding author for this work

Research output: Contribution to journalJournal articlepeer-review

4 Citations (Scopus)

Abstract

In this brief, room-temperature visible electroluminescence (EL) from aluminum nitride (AlN) thin films containing aluminum nanocrystals (nc-Al) prepared by a radio-frequency magnetron sputtering technique is reported. The EL shows a broad spectrum peaked at 565 nm (2.19 eV) when a negative gate voltage is applied. A linear relationship between the EL and the current transport in the nc-Al/AlN thin film system is observed, and both the current transport and the EL intensity exhibit a power-law dependence on the gate voltage. These results are explained in terms of the formation of percolation networks of tunneling paths by the nc-Al arrays and the radiative recombination of the injected electrons and holes via the deep-level defects at the locations of nc-Al along the tunneling paths.

Original languageEnglish
Pages (from-to)3605-3609
Number of pages5
JournalIEEE Transactions on Electron Devices
Volume55
Issue number12
Early online date21 Nov 2008
DOIs
Publication statusPublished - Dec 2008

Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

User-Defined Keywords

  • Aluminum nanocrystal
  • Aluminum nitride
  • Electroluminescence
  • Light emitting device

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