TY - JOUR
T1 - Quantum confinement effect in silicon quantum-well layers
AU - Xia, Jian Bai
AU - Cheah, K.
N1 - This work was supported by a Croucher Foundation Research Grant.
PY - 1997
Y1 - 1997
N2 - The electronic states and optical transition properties of silicon quantum-well layers embedded by (Formula presented) layers are studied by the empirical pseudopotential homojunction model. The energy bands, wave functions, and the optical transition matrix elements are obtained for layers of thickness from 1 to 6 nm, and three oriented directions (001), (110), and (111). It is found that for Si layers in the (001) direction the energy gap is pseudodirect, for those in the (111) direction the energy gap is indirect, while for those in the (110) direction the energy gap is pseudodirect or indirect for a thickness smaller or larger than 3 nm, respectively. The optical transition matrix elements are smaller than that of direct transition, and increase with decreasing layer thickness. When the thickness of a layer is smaller than 2 nm, the Si QW layers have larger transition matrix elements. It is caused by mixing of bulk (Formula presented) states with the (Formula presented) state. The calculated results are compared with experimental results.
AB - The electronic states and optical transition properties of silicon quantum-well layers embedded by (Formula presented) layers are studied by the empirical pseudopotential homojunction model. The energy bands, wave functions, and the optical transition matrix elements are obtained for layers of thickness from 1 to 6 nm, and three oriented directions (001), (110), and (111). It is found that for Si layers in the (001) direction the energy gap is pseudodirect, for those in the (111) direction the energy gap is indirect, while for those in the (110) direction the energy gap is pseudodirect or indirect for a thickness smaller or larger than 3 nm, respectively. The optical transition matrix elements are smaller than that of direct transition, and increase with decreasing layer thickness. When the thickness of a layer is smaller than 2 nm, the Si QW layers have larger transition matrix elements. It is caused by mixing of bulk (Formula presented) states with the (Formula presented) state. The calculated results are compared with experimental results.
UR - http://www.scopus.com/inward/record.url?scp=0000619265&partnerID=8YFLogxK
U2 - 10.1103/PhysRevB.56.14925
DO - 10.1103/PhysRevB.56.14925
M3 - Journal article
AN - SCOPUS:0000619265
SN - 2469-9950
VL - 56
SP - 14925
EP - 14928
JO - Physical Review B
JF - Physical Review B
IS - 23
ER -