Photothermal deflection spectroscopy of polymer thin films

Shu Kong SO*, Mau Hing CHAN, Louis M L LEUNG

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Photothermal Deflection Spectroscopy (PDS) is known to be one of the most sensitive techniques for measuring the absorption of weakly absorbing materials. We have applied PDS for measuring the optical absorption of a few polymer thin-film samples over the wavelength region from 0.4-2.0 μm. The results are useful for optical evaluation of these polymers.

Original languageEnglish
Pages (from-to)159-161
Number of pages3
JournalApplied Physics A: Materials Science and Processing
Volume61
Issue number2
DOIs
Publication statusPublished - Aug 1995

Scopus Subject Areas

  • Chemistry(all)
  • Materials Science(all)

User-Defined Keywords

  • 78.20.Dj
  • 78.66.Qn

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