Photothermal deflection spectroscopy of polymer thin films

S. K. So; M. H. Chan; L. M. Leung

doi:10.1007/BF01538383

Photothermal deflection spectroscopy of polymer thin films

S. K. So^*, M. H. Chan, L. M. Leung

^*Corresponding author for this work

Research output: Contribution to journal › Journal article › peer-review

7 Citations (Scopus)

Abstract

Photothermal Deflection Spectroscopy (PDS) is known to be one of the most sensitive techniques for measuring the absorption of weakly absorbing materials. We have applied PDS for measuring the optical absorption of a few polymer thin-film samples over the wavelength region from 0.4-2.0 μm. The results are useful for optical evaluation of these polymers.

Original language	English
Pages (from-to)	159-161
Number of pages	3
Journal	Applied Physics A: Materials Science and Processing
Volume	61
Issue number	2
DOIs	https://doi.org/10.1007/BF01538383
Publication status	Published - Aug 1995

Scopus Subject Areas

Chemistry(all)
Materials Science(all)

User-Defined Keywords

78.20.Dj
78.66.Qn

Access to Document

10.1007/BF01538383

Cite this

@article{ea00acf3fe854449bcb0ab63a00c8421,

title = "Photothermal deflection spectroscopy of polymer thin films",

abstract = "Photothermal Deflection Spectroscopy (PDS) is known to be one of the most sensitive techniques for measuring the absorption of weakly absorbing materials. We have applied PDS for measuring the optical absorption of a few polymer thin-film samples over the wavelength region from 0.4-2.0 μm. The results are useful for optical evaluation of these polymers.",

keywords = "78.20.Dj, 78.66.Qn",

author = "So, {S. K.} and Chan, {M. H.} and Leung, {L. M.}",

year = "1995",

month = aug,

doi = "10.1007/BF01538383",

language = "English",

volume = "61",

pages = "159--161",

journal = "Applied Physics A: Materials Science and Processing",

issn = "0947-8396",

publisher = "Springer Heidelberg",

number = "2",

}

TY - JOUR

T1 - Photothermal deflection spectroscopy of polymer thin films

AU - So, S. K.

AU - Chan, M. H.

AU - Leung, L. M.

PY - 1995/8

Y1 - 1995/8

N2 - Photothermal Deflection Spectroscopy (PDS) is known to be one of the most sensitive techniques for measuring the absorption of weakly absorbing materials. We have applied PDS for measuring the optical absorption of a few polymer thin-film samples over the wavelength region from 0.4-2.0 μm. The results are useful for optical evaluation of these polymers.

AB - Photothermal Deflection Spectroscopy (PDS) is known to be one of the most sensitive techniques for measuring the absorption of weakly absorbing materials. We have applied PDS for measuring the optical absorption of a few polymer thin-film samples over the wavelength region from 0.4-2.0 μm. The results are useful for optical evaluation of these polymers.

KW - 78.20.Dj

KW - 78.66.Qn

UR - http://www.scopus.com/inward/record.url?scp=0029354347&partnerID=8YFLogxK

U2 - 10.1007/BF01538383

DO - 10.1007/BF01538383

M3 - Journal article

AN - SCOPUS:0029354347

SN - 0947-8396

VL - 61

SP - 159

EP - 161

JO - Applied Physics A: Materials Science and Processing

JF - Applied Physics A: Materials Science and Processing

IS - 2

ER -

Photothermal deflection spectroscopy of polymer thin films

Abstract

Scopus Subject Areas

User-Defined Keywords

Access to Document

Other files and links

Fingerprint

Cite this