Photon-induced conduction modulation in SiO2 thin films embedded with Ge nanocrystals

  • L. Ding
  • , T. P. Chen*
  • , M. Yang
  • , J. I. Wong
  • , Y. Liu
  • , S. F. Yu
  • , Furong Zhu
  • , M. C. Tan
  • , S. Fung
  • , C. H. Tung
  • , A. D. Trigg
  • *Corresponding author for this work

Research output: Contribution to journalJournal articlepeer-review

10 Citations (Scopus)

Abstract

The authors report the photon-induced conduction modulation in Si O2 thin films embedded with germanium nanocrystals (nc-Ge). The conduction of the oxide could be switched to a higher- or lower-conductance state by a ultraviolet (UV) illumination. The conduction modulation is caused by charging and discharging in the nc-Ge due to the UV illumination. If the charging process is dominant, the oxide conductance is reduced; however, if the discharging process is dominant, the oxide conductance is increased. As the conduction can be modulated by UV illumination, it could have potential applications in silicon-based optical memory devices.

Original languageEnglish
Article number103102
Number of pages3
JournalApplied Physics Letters
Volume90
Issue number10
DOIs
Publication statusPublished - 5 Mar 2007

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