TY - JOUR
T1 - Percolation-Engineered Silver Nanowire Transparent Electrodes for Thermally Robust Operation
AU - Marus, Mikita
AU - Mukha, Yauhen
AU - Hubarevich, Aliaksandr
AU - Lyapunov, Nikolay
AU - Smirnov, Aliaksandr
AU - Wang, Shu-Jen
N1 - The authors gratefully acknowledge financial support from the Research Grants Council of Hong Kong (HKBU 22300324), startup funding from Hong Kong Baptist University, the Hong Kong Baptist University Seed Funding for Collaborative Research Grant (RC-SFCRG/23-24/R2/SCI/01), the Shenzhen–Hong Kong–Macau Science and Technology Plan Project – Category C (Grant No. SGCX20250526155033004), and the Guangdong Basic and Applied Basic Research Fund – General Program (Grant No. 2026A1515011773). Authors affiliated with BSUIR also acknowledge funding from the Belarusian Republican Foundation for Fundamental Research (Grant No. T26KI-057). The authors also acknowledge translational and innovation support associated with PRYLADS Limited through the HKBU Inno Realisation Fund, the HKSTP Ideation Programme, and the PolyU Micro Fund Scheme. This work is dedicated to the memory of Dr. Aliaksandr Hubarevich, whose friendship, collaboration, and scientific rigour were a lasting inspiration to us all. We also honour and remember his parents, his wife Volha, and his son Paisij.
Publisher copyright:
© 2026 The Author(s). Published by Elsevier Ltd.
PY - 2026/7/30
Y1 - 2026/7/30
N2 - Silver nanowire (AgNW) transparent conductive films are enabling materials for flexible displays, touch panels, transparent photovoltaics, heaters, soft electronics, and sensors. Their reliability, however, is often limited not by average temperature rise but by highly localized Joule-heating hotspots at a small subset of current-carrying junctions. Here, we introduce a geometry-first, percolation-engineering strategy for designing dependable AgNW films. We explicitly model large-area (2.5 × 2.5 mm2) networks across nanowire length and surface-coverage space, algorithmically separate the conducting backbone from non-percolating nanowires, and solve coupled electrical–thermal transport to map hotspot statistics. The average temperature rise scales quadratically with the applied current, ΔT ≈ SET J 2, where the electrothermal susceptibility coefficient SET is governed primarily by network topology, including nanowire length, surface coverage, and junction resistance. This yields a practical design rule, Jcrit (ℓNW, ϕNW; ΔTcrit) = [ΔTcrit/SET (ℓNW, ϕNW)]1/2, which directly converts morphology into the allowable operating current density for a chosen temperature-rise limit. Guided by these maps, we identify design regimes that suppress hotspots in optoelectronic electrodes while intentionally enhancing heating efficiency in transparent heaters. Experiments on 50 μm AgNW electrodes confirm the predicted electrothermal trends and support a junction-limited conductivity model with an effective conductivity ~20× lower at nanowire intersections. The resulting framework complements additive encapsulation and welding strategies and provides a practical route to select AgNW morphology for electrothermal robustness, while offering a natural basis for future integration with established AgNW optical-performance models.
AB - Silver nanowire (AgNW) transparent conductive films are enabling materials for flexible displays, touch panels, transparent photovoltaics, heaters, soft electronics, and sensors. Their reliability, however, is often limited not by average temperature rise but by highly localized Joule-heating hotspots at a small subset of current-carrying junctions. Here, we introduce a geometry-first, percolation-engineering strategy for designing dependable AgNW films. We explicitly model large-area (2.5 × 2.5 mm2) networks across nanowire length and surface-coverage space, algorithmically separate the conducting backbone from non-percolating nanowires, and solve coupled electrical–thermal transport to map hotspot statistics. The average temperature rise scales quadratically with the applied current, ΔT ≈ SET J 2, where the electrothermal susceptibility coefficient SET is governed primarily by network topology, including nanowire length, surface coverage, and junction resistance. This yields a practical design rule, Jcrit (ℓNW, ϕNW; ΔTcrit) = [ΔTcrit/SET (ℓNW, ϕNW)]1/2, which directly converts morphology into the allowable operating current density for a chosen temperature-rise limit. Guided by these maps, we identify design regimes that suppress hotspots in optoelectronic electrodes while intentionally enhancing heating efficiency in transparent heaters. Experiments on 50 μm AgNW electrodes confirm the predicted electrothermal trends and support a junction-limited conductivity model with an effective conductivity ~20× lower at nanowire intersections. The resulting framework complements additive encapsulation and welding strategies and provides a practical route to select AgNW morphology for electrothermal robustness, while offering a natural basis for future integration with established AgNW optical-performance models.
KW - Joule heating
KW - Electromigration
KW - Electrothermal reliability
KW - Transparent conductive films
KW - Percolation
KW - Silver nanowires
UR - https://www.scopus.com/pages/publications/105045927789
U2 - 10.1016/j.mtcomm.2026.115799
DO - 10.1016/j.mtcomm.2026.115799
M3 - Journal article
SN - 2352-4928
VL - 55
JO - Materials Today Communications
JF - Materials Today Communications
M1 - 115799
ER -