Abstract
Optimised thickness of the individual layers in any thin film a-Si:H solar cell can be obtained using optical analysis method. By minimising the reflectance using an optimal anti-reflection coating layer and selecting a suitable rear contact material, a significant increase in the photon collection efficiency at long wavelength can be achieved. The effect of the variation in thickness of different layers on the performance characteristics of a cell is discussed. The calculated results and analyses show that the present method can be used directly to design any thin film solar cell with an optimised structure for a desired possible high efficiency.
| Original language | English |
|---|---|
| Title of host publication | Conference Record of the Twenty Third IEEE Photovoltaic Specialists Conference - 1993 |
| Publisher | IEEE |
| Pages | 1047-1050 |
| Number of pages | 4 |
| ISBN (Print) | 0780312201 |
| DOIs | |
| Publication status | Published - 10 May 1993 |
| Event | 23rd IEEE Photovoltaic Specialists Conference - Louisville, KY, USA Duration: 10 May 1993 → 14 May 1993 https://ieeexplore.ieee.org/xpl/conhome/1061/proceeding |
Publication series
| Name | Conference Record of the Twenty Third IEEE Photovoltaic Specialists Conference |
|---|---|
| ISSN (Print) | 0160-8371 |
Conference
| Conference | 23rd IEEE Photovoltaic Specialists Conference |
|---|---|
| City | Louisville, KY, USA |
| Period | 10/05/93 → 14/05/93 |
| Internet address |
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