On the manifestation of faults to errors in signature analysis

John C. Chan; Baxter F. Womack; D.F. Wong

doi:10.1109/ICCD.1991.139919

On the manifestation of faults to errors in signature analysis

John C. Chan, Baxter F. Womack, D.F. Wong

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Research output: Chapter in book/report/conference proceeding › Conference proceeding

Abstract

The study of the relation between faults and its syndromes in the signature analysis of computer hardware testing is presented. When an incorrect signature is observed, it is caused by one of many possible error sequences that contains errors at different locations. The characteristics of the error distributions are identified for greater fault coverage. Formal analysis is presented in conjunction with the subject of error-control code. The results provide insights into the use of deterministic test patterns in signature analysis.

Original language	English
Title of host publication	[1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors
Publisher	IEEE
Pages	360-363
Number of pages	4
ISBN (Print)	0818622709
DOIs	https://doi.org/10.1109/ICCD.1991.139919
Publication status	Published - 16 Oct 1991
Event	1991 IEEE International Conference on Computer Design, ICCD 1991: VLSI in Computers and Processors - Cambridge, MA, United States Duration: 14 Oct 1991 → 16 Oct 1991 https://ieeexplore.ieee.org/xpl/conhome/367/proceeding

Publication series

Name	IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD

Conference

Conference	1991 IEEE International Conference on Computer Design, ICCD 1991
Country/Territory	United States
City	Cambridge, MA
Period	14/10/91 → 16/10/91
Internet address	https://ieeexplore.ieee.org/xpl/conhome/367/proceeding

User-Defined Keywords

Error analysis
Circuit faults
Built-in self-test
Computer errors
Circuit testing
Polynomials
Linear feedback shift registers
Logic testing
Fault detection
Fault diagnosis

Access to Document

10.1109/ICCD.1991.139919

Cite this

Chan, J. C., Womack, B. F., & Wong, D. F. (1991). On the manifestation of faults to errors in signature analysis. In [1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors (pp. 360-363). (IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD). IEEE. https://doi.org/10.1109/ICCD.1991.139919

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title = "On the manifestation of faults to errors in signature analysis",

abstract = "The study of the relation between faults and its syndromes in the signature analysis of computer hardware testing is presented. When an incorrect signature is observed, it is caused by one of many possible error sequences that contains errors at different locations. The characteristics of the error distributions are identified for greater fault coverage. Formal analysis is presented in conjunction with the subject of error-control code. The results provide insights into the use of deterministic test patterns in signature analysis.",

keywords = "Error analysis, Circuit faults, Built-in self-test, Computer errors, Circuit testing, Polynomials, Linear feedback shift registers, Logic testing, Fault detection, Fault diagnosis",

author = "Chan, {John C.} and Womack, {Baxter F.} and D.F. Wong",

year = "1991",

month = oct,

day = "16",

doi = "10.1109/ICCD.1991.139919",

language = "English",

isbn = "0818622709",

series = "IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD",

publisher = "IEEE",

pages = "360--363",

booktitle = "[1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors",

address = "United States",

note = "1991 IEEE International Conference on Computer Design, ICCD 1991 : VLSI in Computers and Processors ; Conference date: 14-10-1991 Through 16-10-1991",

url = "https://ieeexplore.ieee.org/xpl/conhome/367/proceeding",

}

Chan, JC, Womack, BF & Wong, DF 1991, On the manifestation of faults to errors in signature analysis. in [1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors. IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD, IEEE, pp. 360-363, 1991 IEEE International Conference on Computer Design, ICCD 1991, Cambridge, MA, United States, 14/10/91. https://doi.org/10.1109/ICCD.1991.139919

On the manifestation of faults to errors in signature analysis. / Chan, John C.; Womack, Baxter F.; Wong, D.F.
[1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors. IEEE, 1991. p. 360-363 (IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD).

Research output: Chapter in book/report/conference proceeding › Conference proceeding

TY - GEN

T1 - On the manifestation of faults to errors in signature analysis

AU - Chan, John C.

AU - Womack, Baxter F.

AU - Wong, D.F.

PY - 1991/10/16

Y1 - 1991/10/16

N2 - The study of the relation between faults and its syndromes in the signature analysis of computer hardware testing is presented. When an incorrect signature is observed, it is caused by one of many possible error sequences that contains errors at different locations. The characteristics of the error distributions are identified for greater fault coverage. Formal analysis is presented in conjunction with the subject of error-control code. The results provide insights into the use of deterministic test patterns in signature analysis.

AB - The study of the relation between faults and its syndromes in the signature analysis of computer hardware testing is presented. When an incorrect signature is observed, it is caused by one of many possible error sequences that contains errors at different locations. The characteristics of the error distributions are identified for greater fault coverage. Formal analysis is presented in conjunction with the subject of error-control code. The results provide insights into the use of deterministic test patterns in signature analysis.

KW - Error analysis

KW - Circuit faults

KW - Built-in self-test

KW - Computer errors

KW - Circuit testing

KW - Polynomials

KW - Linear feedback shift registers

KW - Logic testing

KW - Fault detection

KW - Fault diagnosis

UR - https://ieeexplore.ieee.org/document/139919/

U2 - 10.1109/ICCD.1991.139919

DO - 10.1109/ICCD.1991.139919

M3 - Conference proceeding

SN - 0818622709

T3 - IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD

SP - 360

EP - 363

BT - [1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors

PB - IEEE

T2 - 1991 IEEE International Conference on Computer Design, ICCD 1991

Y2 - 14 October 1991 through 16 October 1991

ER -

On the manifestation of faults to errors in signature analysis

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