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ODCL: An Object Disentanglement and Contrastive Learning Model for Few-Shot Industrial Defect Detection
- Guodong Li
- , Furong Peng*
- , Zhisheng Wu
- , Sheng Wang
- , Richard Yi Da Xu
*Corresponding author for this work
Research output: Contribution to journal › Journal article › peer-review
9
Citations
(Scopus)