Near field imaging from multilayer lens

Guixin LI, Jensen Li, Hoi Lam TAM, C. T. Chan*, Kok Wai CHEAH

*Corresponding author for this work

Research output: Contribution to journalJournal articlepeer-review

2 Citations (Scopus)


Multilayer superlens has been reported that it had advantages over the single metal layer superlens. In this work, single silver layer and Ag-SiO 2 multilayer superlens devices working at wavelength of 365 nm were fabricated using standard photolithography method. Grating objects with line/space (190 nm/190 nm) resolution could be resolved through both kinds of lens structures with working distance up to 128 nm. However, Ag-SiO 2 multilayer lens shows higher transmittance and image contrast than the single silver layer device, the experimental result proves the theoretical calculation.

Original languageEnglish
Pages (from-to)10725-10728
Number of pages4
JournalJournal of Nanoscience and Nanotechnology
Issue number12
Publication statusPublished - 2011

Scopus Subject Areas

  • Bioengineering
  • Chemistry(all)
  • Biomedical Engineering
  • Materials Science(all)
  • Condensed Matter Physics

User-Defined Keywords

  • Imaging
  • Near field
  • Subwavelength
  • Superlens


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