Modeling of probabilistic ripple-carry adders

Mark S.K. Lau; Keck Voon Ling; Yun Chung Chu; Arun Bhanu

doi:10.1109/DELTA.2010.14

Modeling of probabilistic ripple-carry adders

Mark S.K. Lau
, Keck Voon Ling
, Yun Chung Chu
, Arun Bhanu

Department of Mathematics

Research output: Chapter in book/report/conference proceeding › Conference proceeding › peer-review

11 Citations (Scopus)

Abstract

This paper proposes a mathematical model for probabilistic ripple-carry adders. The model gives explicit expressions for calculating error probabilities of sum and carry bits. The expressions show how errors propagate through the carry, which accumulate and eventually influence the correctness of a ripple-carry adder's outputs. The proposed model is flexible since it only requires mild assumptions on the probability distribution of noise. Hence, in addition to Gaussian, it is applicable to a wide class of distributions. We validate the model through HSPICE simulation. The model is able to predict error-rates of a simulated probabilistic ripple-carry adder with reasonable accuracy.

Original language	English
Title of host publication	Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010
Editors	Bob Werner
Publisher	IEEE
Pages	201-206
Number of pages	6
ISBN (Electronic)	9781424460267
ISBN (Print)	9780769539782, 9781424460250
DOIs	https://doi.org/10.1109/DELTA.2010.14
Publication status	Published - 13 Jan 2010
Event	5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010 - Ho Chi Minh City, Viet Nam Duration: 13 Jan 2010 → 15 Jan 2010 https://ieeexplore.ieee.org/xpl/conhome/5438527/proceeding (Conference Proceedings)

Publication series

Name	Proceedings - IEEE International Symposium on Electronic Design, Test and Applications, DELTA

Conference

Conference	5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010
Country/Territory	Viet Nam
City	Ho Chi Minh City
Period	13/01/10 → 15/01/10
Internet address	https://ieeexplore.ieee.org/xpl/conhome/5438527/proceeding (Conference Proceedings)

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

User-Defined Keywords

Error propagation
Noise modeling
Probabilistic computation
Ripple-carry adder

Access to Document

10.1109/DELTA.2010.14

Cite this

Lau, M. S. K., Ling, K. V., Chu, Y. C., & Bhanu, A. (2010). Modeling of probabilistic ripple-carry adders. In B. Werner (Ed.), Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010 (pp. 201-206). (Proceedings - IEEE International Symposium on Electronic Design, Test and Applications, DELTA). IEEE. https://doi.org/10.1109/DELTA.2010.14

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title = "Modeling of probabilistic ripple-carry adders",

abstract = "This paper proposes a mathematical model for probabilistic ripple-carry adders. The model gives explicit expressions for calculating error probabilities of sum and carry bits. The expressions show how errors propagate through the carry, which accumulate and eventually influence the correctness of a ripple-carry adder's outputs. The proposed model is flexible since it only requires mild assumptions on the probability distribution of noise. Hence, in addition to Gaussian, it is applicable to a wide class of distributions. We validate the model through HSPICE simulation. The model is able to predict error-rates of a simulated probabilistic ripple-carry adder with reasonable accuracy.",

keywords = "Error propagation, Noise modeling, Probabilistic computation, Ripple-carry adder",

author = "Lau, \{Mark S.K.\} and Ling, \{Keck Voon\} and Chu, \{Yun Chung\} and Arun Bhanu",

note = "This work was supported by Institute for Sustainable Na-noelectronics, Nanyang Technological University (Project Ref: M58B30001). Publisher copyright: {\textcopyright} 2010 IEEE; 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010 ; Conference date: 13-01-2010 Through 15-01-2010",

year = "2010",

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doi = "10.1109/DELTA.2010.14",

language = "English",

isbn = "9780769539782",

series = "Proceedings - IEEE International Symposium on Electronic Design, Test and Applications, DELTA",

publisher = "IEEE",

pages = "201--206",

editor = "Bob Werner",

booktitle = "Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010",

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}

Lau, MSK, Ling, KV, Chu, YC & Bhanu, A 2010, Modeling of probabilistic ripple-carry adders. in B Werner (ed.), Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010. Proceedings - IEEE International Symposium on Electronic Design, Test and Applications, DELTA, IEEE, pp. 201-206, 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010, Ho Chi Minh City, Viet Nam, 13/01/10. https://doi.org/10.1109/DELTA.2010.14

Modeling of probabilistic ripple-carry adders. / Lau, Mark S.K.; Ling, Keck Voon; Chu, Yun Chung et al.
Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010. ed. / Bob Werner. IEEE, 2010. p. 201-206 (Proceedings - IEEE International Symposium on Electronic Design, Test and Applications, DELTA).

Research output: Chapter in book/report/conference proceeding › Conference proceeding › peer-review

TY - GEN

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AU - Bhanu, Arun

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N2 - This paper proposes a mathematical model for probabilistic ripple-carry adders. The model gives explicit expressions for calculating error probabilities of sum and carry bits. The expressions show how errors propagate through the carry, which accumulate and eventually influence the correctness of a ripple-carry adder's outputs. The proposed model is flexible since it only requires mild assumptions on the probability distribution of noise. Hence, in addition to Gaussian, it is applicable to a wide class of distributions. We validate the model through HSPICE simulation. The model is able to predict error-rates of a simulated probabilistic ripple-carry adder with reasonable accuracy.

AB - This paper proposes a mathematical model for probabilistic ripple-carry adders. The model gives explicit expressions for calculating error probabilities of sum and carry bits. The expressions show how errors propagate through the carry, which accumulate and eventually influence the correctness of a ripple-carry adder's outputs. The proposed model is flexible since it only requires mild assumptions on the probability distribution of noise. Hence, in addition to Gaussian, it is applicable to a wide class of distributions. We validate the model through HSPICE simulation. The model is able to predict error-rates of a simulated probabilistic ripple-carry adder with reasonable accuracy.

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KW - Noise modeling

KW - Probabilistic computation

KW - Ripple-carry adder

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Modeling of probabilistic ripple-carry adders

Abstract

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User-Defined Keywords

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