TY - GEN
T1 - Iterative dynamic generic learning for single sample face recognition with a contaminated gallery
AU - Pang, Meng
AU - Cheung, Yiu Ming
AU - Shi, Qiquan
AU - Li, Mengke
N1 - Funding Information:
This work was supported in part by NSFC (Grant No. 61672444), in part by Hong Kong Baptist University (HKBU), Research Committee, IG-FNRA 2018/19 (Grant No. RC-FNRA-IG/18-19/SCI/03), in part by the Innovation andTechnology Fund of Innovation and Technology Commission of the Government of the Hong Kong SAR (Project No. ITS/339/18), and in part by the SZSTI (Grant No. JCYJ20160531194006833). Yiu-ming Cheung is the corresponding author (email: [email protected]).
PY - 2020/7
Y1 - 2020/7
N2 - This paper studies a new challenging problem in face recognition (FR) with single sample per person (SSPP), i.e., SSPP FR with a contaminated gallery (SSPP-CG FR), where the gallery is contaminated by variations. In SSPP-CG FR, the popular generic learning methods will suffer serious performance degradation because the applied prototype plus variation (P+V) model is not suitable in such scenarios. The reasons are twofold: 1) The contaminated gallery samples yield bad prototypes to represent the persons; 2) The generated variation dictionary is simply based on the subtraction of average face from generic samples of the same person and cannot well depict the intra-personal variations. To tackle SSPPCG FR, we propose a novel Iterative Dynamic Generic Learning (IDGL) method, where the labeled gallery and unlabeled query sets are fed into a dynamic label feedback network for learning. Specifically, IDGL first recovers the prototypes via a semi-supervised low-rank representation (SSLRR) framework and learns a representative variation dictionary by extracting the 'sample-specific' corruptions from an auxiliary generic set. Then, it puts them into the P+V model to estimate labels for query samples. Subsequently, the estimated labels are used as the feedbacks to modify the SSLRR, thus updating new prototypes for the next round of P+V based label estimation. With the dynamic learning network, the accuracy of the estimated labels is improved iteratively owing to the steadily enhanced prototypes. Experiments on various benchmark databases have verified the superiority of IDGL.
AB - This paper studies a new challenging problem in face recognition (FR) with single sample per person (SSPP), i.e., SSPP FR with a contaminated gallery (SSPP-CG FR), where the gallery is contaminated by variations. In SSPP-CG FR, the popular generic learning methods will suffer serious performance degradation because the applied prototype plus variation (P+V) model is not suitable in such scenarios. The reasons are twofold: 1) The contaminated gallery samples yield bad prototypes to represent the persons; 2) The generated variation dictionary is simply based on the subtraction of average face from generic samples of the same person and cannot well depict the intra-personal variations. To tackle SSPPCG FR, we propose a novel Iterative Dynamic Generic Learning (IDGL) method, where the labeled gallery and unlabeled query sets are fed into a dynamic label feedback network for learning. Specifically, IDGL first recovers the prototypes via a semi-supervised low-rank representation (SSLRR) framework and learns a representative variation dictionary by extracting the 'sample-specific' corruptions from an auxiliary generic set. Then, it puts them into the P+V model to estimate labels for query samples. Subsequently, the estimated labels are used as the feedbacks to modify the SSLRR, thus updating new prototypes for the next round of P+V based label estimation. With the dynamic learning network, the accuracy of the estimated labels is improved iteratively owing to the steadily enhanced prototypes. Experiments on various benchmark databases have verified the superiority of IDGL.
KW - Contaminated gallery set
KW - Face recognition
KW - Low-rank representation
KW - Single sample per person
UR - http://www.scopus.com/inward/record.url?scp=85090396456&partnerID=8YFLogxK
U2 - 10.1109/ICME46284.2020.9102792
DO - 10.1109/ICME46284.2020.9102792
M3 - Conference proceeding
AN - SCOPUS:85090396456
SN - 9781728113326
T3 - Proceedings - IEEE International Conference on Multimedia and Expo
BT - 2020 IEEE International Conference on Multimedia and Expo, ICME 2020
PB - IEEE Computer Society
T2 - 2020 IEEE International Conference on Multimedia and Expo, ICME 2020
Y2 - 6 July 2020 through 10 July 2020
ER -