IT-DSE: Invariance Risk Minimized Transfer Microarchitecture Design Space Exploration: Invariance Risk Minimized Transfer Microarchitecture Design Space Exploration

Ziyang Yu, Chen Bail, Shoubo Hu, Ran Chen, Taohai He, Mingxuan Yuan, Bei Yu, Martin Wong

Research output: Chapter in book/report/conference proceedingConference proceedingpeer-review

3 Citations (Scopus)

Abstract

The microarchitecture design of processors faces growing complexity due to expanding design space and time-intensive verification processes. Utilizing historical design task data can improve the search process, but managing distribution discrepancies between different source tasks is essential for enhancing the search method's generalization ability. In light of this, we introduce IT-DSE, a microarchitecture searching framework with the surrogate model pre-trained to absorb knowledge from previous design tasks. The Feature Tokenizer-Transformer (FT-Transformer) serves as a backbone, facilitating feature extraction from source tasks even with varied design spaces. Concurrently, the invariant risk minimization (IRM) paradigm bolsters generalization ability under data distribution discrepancies. Further, IT-DSE exploits a combination of multi-objective Bayesian optimization and a model ensemble to discover Pareto-optimal designs Experimental results indicate that IT-DSE effectively harnesses the knowledge of existing microarchitecture designs and uncovers designs that outperform previous methods in terms of power, performance, and area (PPA).

Original languageEnglish
Title of host publication2023 42nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2023 - Proceedings
PublisherIEEE
Pages1-9
Number of pages9
ISBN (Electronic)9798350322255
ISBN (Print)9798350322262
DOIs
Publication statusPublished - Oct 2023
Event42nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2023 - San Francisco, United States
Duration: 28 Oct 20232 Nov 2023
https://ieeexplore.ieee.org/xpl/conhome/10323590/proceeding

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design, ICCAD
ISSN (Print)1933-7760
ISSN (Electronic)1558-2434

Conference

Conference42nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2023
Country/TerritoryUnited States
CitySan Francisco
Period28/10/232/11/23
Internet address

Scopus Subject Areas

  • Software
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

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