Is your layout density verification exact? A fast exact algorithm for density calculation

Hua Xiang, Kai-Yuan Chao, Ruchir Puri, Martin D. F. Wong

Research output: Chapter in book/report/conference proceedingConference proceedingpeer-review

9 Citations (Scopus)

Abstract

As the device shapes keep shrinking, the designs are more sensitive to manufacturing processes. In order to improve performance predictability and yield, mask layout uniformity/evenness is highly desired, and it is usually measured by the feature density with defined feasible range in manufacture process design rules. To address the density control problem, one fundamental problem is how to calculate density accurately and efficiently. In this paper, we propose a fast exact algorithm to identify the maximum density for a given layout. Compared with the existing exact algorithms, our algorithm reduces the running time from days/hours to a few minutes/seconds. And it is even faster than the existing approximate algorithms in literature.

Original languageEnglish
Title of host publicationISPD '07
Subtitle of host publicationProceedings of the 2007 International Symposium on Physical Design
PublisherAssociation for Computing Machinery (ACM)
Pages19-26
Number of pages8
ISBN (Print)9781595936134
DOIs
Publication statusPublished - 18 Mar 2007
Event16th International Symposium on Physical Design, ISPD 2007 - Austin , United States
Duration: 18 Mar 200721 Mar 2007
https://dl.acm.org/doi/proceedings/10.1145/1231996 (Conference proceedings)

Publication series

NameProceedings of the International Symposium on Physical Design, ISPD

Symposium

Symposium16th International Symposium on Physical Design, ISPD 2007
Country/TerritoryUnited States
CityAustin
Period18/03/0721/03/07
Internet address

Scopus Subject Areas

  • Electrical and Electronic Engineering

User-Defined Keywords

  • Density
  • Fix-dissection
  • DFM

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