Abstract
It is proposed that inhomogeneities in the deposition rate can be a powerful tool for investigating properties of growing films. The macroscopic shape of the resulting surface deformation is discussed analytically for the growth equation proposed by Kardar, Parisi, and Zhang [Phys. Rev. Lett. 56, 889 (1986)]. Computer simulations for a single-step growth model confirm the predictions based on this equation and give explicit values for its parameters. It is argued that inhomogeneous deposition also provides a new method for measuring the roughness exponent.
Original language | English |
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Pages (from-to) | 1591-1594 |
Number of pages | 4 |
Journal | Physical Review Letters |
Volume | 65 |
Issue number | 13 |
DOIs | |
Publication status | Published - 24 Sept 1990 |