Influence of different atmospheres on the life time of porous silicon light-emitting devices

Keyphrases

• Reverse Bias 100%
• Porous Silicon 100%
• Silicon Light Source 100%
• Electroluminescence 80%
• Forward Bias 80%
• Photoluminescence 80%
• I-V Characteristics 40%
• Room Temperature 20%
• Visible Spectrum 20%
• Photoluminescence Spectra 20%
• Electroluminescence Spectra 20%
• Energy Dispersive X-ray Spectroscopy 20%
• Applied Voltage 20%
• Degradation Mechanism 20%
• Possible Mechanisms 20%
• Full Width at Half Maximum 20%
• Oxygen Diffusion 20%
• Degradation Process 20%
• Characteristics Measurement 20%
• Au Contacts 20%
• Spectral Shape 20%
• Metal Diffusion 20%
• AuCu Alloy 20%
• Lifetime Degradation 20%
• Ionic States 20%

Engineering

• Porous Silicon 100%
• Luminaires 100%
• Emitting Device 100%
• Reverse Bias 100%
• Forward Bias 80%
• Current-Voltage Characteristic 40%
• Room Temperature 20%
• Energy dispersive spectrometry 20%
• Applied Voltage 20%
• Degradation Process 20%

Physics

• Photoluminescence 100%
• Porous Silicon 100%
• Electroluminescence 100%
• Room Temperature 20%
• Red Shift 20%
• X Ray Spectroscopy 20%
• Copper Alloy 20%