Implementation of all-optical bit-error monitoring system using cascaded optical logic gates

K. K. Qureshi, W. H. Chung, H. Y. Tam, L. Y. Chan, Alex Wai, L. F. K. Lui

Research output: Chapter in book/report/conference proceedingConference proceedingpeer-review

Abstract

An all-optical bit-error monitoring system based on cascaded optical NOT and NOR gates operating at different threshold levels is presented. Real-time optical monitoring signal is generated which indicates the positions and duration of both bit and burst errors in 10 Gb/s NRZ signal.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics, CLEO 2003
PublisherOptica Publishing Group
Number of pages2
ISBN (Electronic)1557527334
Publication statusPublished - Jun 2003
EventConference on Lasers and Electro-Optics, CLEO 2003 - Baltimore, United States
Duration: 1 Jun 20036 Jun 2003
https://opg.optica.org/conference.cfm?meetingid=18&yr=2003

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701
NameOSA Trends in Optics and Photonics Series
PublisherOptical Society of America
Volume88

Conference

ConferenceConference on Lasers and Electro-Optics, CLEO 2003
Country/TerritoryUnited States
CityBaltimore
Period1/06/036/06/03
Internet address

Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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