Image denoising based on nonlocal Bayesian singular value thresholding and Stein's unbiased risk estimator

Caoyuan Li, Hong Bo Xie*, Xuhui Fan, Yi Da Xu, Sabine Van Huffel, Scott A. Sisson, Kerrie Mengersen

*Corresponding author for this work

Research output: Contribution to journalJournal articlepeer-review

11 Citations (Scopus)

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Engineering & Materials Science