Abstract
Semicontinuous metals films of copper and gold were grown on different substrates by pulsed laser ablation. The resistance and transmittance of these growing metal films were monitored in situ vs film thickness. Despite diverse experimental variations, it was found that both resistance and transmittance exhibited similar behaviors. Around percolation, the resistance exhibited a sharp drop whereas the transmittance exhibited a dip. In general, the onset of percolation depended on laser fluence and substrates. Under favorable conditions, metal films as thin as 1.5 nm would percolate.
Original language | English |
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Pages (from-to) | O10.7.1-O10.7.6 |
Number of pages | 6 |
Journal | Materials Research Society Symposium Proceedings |
Volume | 672 |
DOIs | |
Publication status | Published - 2001 |
Event | Mechanisms of Surface and Microstructure Evolution in Deposited Films and Structures - San Francisco, CA, United States Duration: 17 Apr 2001 → 20 Apr 2001 |
Scopus Subject Areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering