Growth and characterization of semicontinuous metal films by pulsed laser ablation

Shu Kong SO*, H. H. Fong, Nai Ho CHEUNG

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

Semicontinuous metals films of copper and gold were grown on different substrates by pulsed laser ablation. The resistance and transmittance of these growing metal films were monitored in situ vs film thickness. Despite diverse experimental variations, it was found that both resistance and transmittance exhibited similar behaviors. Around percolation, the resistance exhibited a sharp drop whereas the transmittance exhibited a dip. In general, the onset of percolation depended on laser fluence and substrates. Under favorable conditions, metal films as thin as 1.5 nm would percolate.

Original languageEnglish
Pages (from-to)O10.7.1-O10.7.6
JournalMaterials Research Society Symposium Proceedings
Volume672
DOIs
Publication statusPublished - 2001
EventMechanisms of Surface and Microstructure Evolution in Deposited Films and Structures - San Francisco, CA, United States
Duration: 17 Apr 200120 Apr 2001

Scopus Subject Areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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