Formation of nanosize poly (p-phenylene vinylene) in porous silicon substrate

P. Le Rendu, T. P. Nguyen*, Kok Wai CHEAH, P. Joubert

*Corresponding author for this work

Research output: Contribution to journalJournal articlepeer-review

12 Citations (Scopus)


We report the results of optical investigations in porous silicon (PS)/poly(p-phenylene vinylene) (PPV) systems obtained by filling the pores of silicon wafers with polymer. By scanning electron microscopy (SEM), IR, and Raman spectroscopy, we observed that the porous silicon layer was thoroughly filled by the polymer with no significant change in the structure of the materials. This suggests that there is no interaction between the components. On the other hand, the photoluminescence (PL) spectra of the devices investigated at different temperatures (from 11 to 290 K) showed that both materials are active at low temperatures. Porous silicon has a band located at 398 nm while PPV has two bands at 528 and 570 nm. As the temperature increases, the PL intensity of porous silicon decreases and that PPV is blue shifted. A new band emerging at 473 nm may indicate an energy transfer from the porous silicon to PPV, involving short segments of the polymer. The band of PPV located at 515 nm becomes more dominant and indicates that the nanosize polymer films are formed in the pores of the silicon layer, in agreement with the results obtained by SEM, IR, and Raman analyses.

Original languageEnglish
Pages (from-to)847-850
Number of pages4
JournalMaterials Science and Engineering C
Issue number6-8
Publication statusPublished - 15 Dec 2003

Scopus Subject Areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

User-Defined Keywords

  • Infrared
  • Photoluminescence
  • Porous silicon
  • PPV
  • Raman


Dive into the research topics of 'Formation of nanosize poly (p-phenylene vinylene) in porous silicon substrate'. Together they form a unique fingerprint.

Cite this