Face illumination normalization on large and small scale features

Xiaohua Xie, Wei Shi Zheng, Jianhuang Lai*, Pong Chi YUEN

*Corresponding author for this work

Research output: Chapter in book/report/conference proceedingConference contributionpeer-review

54 Citations (Scopus)

Abstract

It is well known that the effect of illumination is mainly on the large-scale features (low-frequency components) of a face image. In solving the illumination problem for face recognition, most (if not all) existing methods either only use extracted small-scale features while discard large-scale features, or perform normalization on the whole image. In the latter case, small-scale features may be distorted when the large-scale features are modified. In this paper, we argue that large-scale features of face image are important and contain useful information for face recognition as well as visual quality of normalized image. Moreover, this paper suggests that illumination normalization should mainly perform on large-scale features of face image rather than the whole face image. Along this line, a novel framework for face illumination normalization is proposed. In this framework, a single face image is first decomposed into large- and small- scale feature images using logarithmic total variation (LTV) model. After that, illumination normalization is performed on large-scale feature image while small-scale feature image is smoothed. Finally, a normalized face image is generated by combination of the normalized large-scale feature image and smoothed small-scale feature image. CMU PIE and (Extended) YaleB face databases with different illumination variations are used for evaluation and the experimental results show that the proposed method outperforms existing methods.

Original languageEnglish
Title of host publication26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR
DOIs
Publication statusPublished - 2008
Event26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR - Anchorage, AK, United States
Duration: 23 Jun 200828 Jun 2008

Publication series

Name26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR

Conference

Conference26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR
Country/TerritoryUnited States
CityAnchorage, AK
Period23/06/0828/06/08

Scopus Subject Areas

  • Computer Vision and Pattern Recognition
  • Control and Systems Engineering

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