Extrinsic electron traps in tris(8-hydroxyquinoline) aluminium

Honhang Fong, Kachu Lun, Shu Kong SO*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

41 Citations (Scopus)

Abstract

Optical time-of-flight (TOF) technique was used to measure the electron mobility of tris(8-hydroxyquinoline) aluminum (Alq3) exposed to different gases. When freshly prepared Alq3 sample was exposed to air, the TOF signal was observed to be highly dispersive. After annealing the sample to 370 K for 12 h, the signal became non-dispersive. The field dependence of the electron mobility was found to exhibit Poole-Frenkel form between 250-380 K. The effects of various ambient gases (N2, O2, H2O) to the electron mobility were examined. It is found that O2 acts as an extrinsic dopant and induces electron traps in bulk Alq3.

Original languageEnglish
Pages (from-to)L1122-L1125
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume41
Issue number10 A
DOIs
Publication statusPublished - 1 Oct 2002

Scopus Subject Areas

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

User-Defined Keywords

  • Carrier mobility
  • Hydroxyquinoline aluminum
  • Organic transporting materials

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