Evidence of nitric-oxide-induced surface band bending of indium tin oxide

Jianqiao Hu, Jisheng Pan, Furong Zhu*, Hao Gong

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)

Abstract

The interaction of indium tin oxide (ITO) film with nitric oxide (NO) has been investigated in situ by a four-point probe and x-ray photoelectron spectroscopy (XPS). The XPS N 1s peak emerged at a high binding energy of 404 eV indicating that NO was molecularly adsorbed on ITO surface. The adsorption of NO on ITO surface also induced a 0.2 eV shift in its valence band maximum to the low binding energy side leading to an upward surface band bending. We have shown that the increase in the ITO sheet resistance was attributed to its surface band bending.

Original languageEnglish
Pages (from-to)6273-6276
Number of pages4
JournalJournal of Applied Physics
Volume95
Issue number11
DOIs
Publication statusPublished - 1 Jun 2004
Externally publishedYes

Scopus Subject Areas

  • Physics and Astronomy(all)

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