Abstract
Two-dimensional arrays of Si tips for electron field emission were fabricated using combination of photolithography and electrochemical etching. The array has good uniformity and near optimum shape for field emission. The current-voltage characteristics were measured and fitted with the Fowler-Nordheim model. The derived field enhancement factors are among the best figures of merit for electron field emitters. The result shows that Si tip array fabricated with this process has potential applications in vacuum microelectronics.
Original language | English |
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Article number | 6324 |
Pages (from-to) | 205-207 |
Number of pages | 3 |
Journal | Solid State Communications |
Volume | 123 |
Issue number | 5 |
DOIs | |
Publication status | Published - Aug 2002 |
Scopus Subject Areas
- Chemistry(all)
- Condensed Matter Physics
- Materials Chemistry
User-Defined Keywords
- A. si tip array
- E. electron field emission