Electron-beam-induced cracking in organic-inorganic halide Perovskite thin films

Srinivas K. Yadavalli, Min Chen, Mingyu Hu, Zhenghong Dai, Yuanyuan ZHOU, Nitin P. Padture*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Electron-beam-induced cracking in organic-inorganic halide Perovskite thin films'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science

Chemical Compounds