Electron-beam-induced cracking in organic-inorganic halide Perovskite thin films

Srinivas K. Yadavalli; Min Chen; Mingyu Hu; Zhenghong Dai; Yuanyuan Zhou; Nitin P. Padture

doi:10.1016/j.scriptamat.2020.05.062

Electron-beam-induced cracking in organic-inorganic halide Perovskite thin films

Srinivas K. Yadavalli, Min Chen, Mingyu Hu, Zhenghong Dai, Yuanyuan Zhou, Nitin P. Padture^*

^*Corresponding author for this work

Department of Physics

Research output: Contribution to journal › Journal article › peer-review

19 Citations (Scopus)

Abstract

The curious phenomenon of cracking in organic-inorganic halide perovskite (OIHP) thin films for solar cells during scanning electron microscopy (SEM) can be seen in literally thousands of published SEM micrographs. Here we demonstrate, for the first time, the mechanisms responsible for this e-beam-induced damage in OIHP thin films, which is precluding their detailed SEM-characterization and understanding. The e-beam-induced rapid volatilization of the organic species from the OIHP surface in the SEM results in localized shrinkage and buildup of tensile stresses. These stresses drive grain-boundaries cracking, resulting in a ‘mud-cracking’ pattern that is influenced by the thin-film grain size.

Original language	English
Pages (from-to)	88-92
Number of pages	5
Journal	Scripta Materialia
Volume	187
DOIs	https://doi.org/10.1016/j.scriptamat.2020.05.062
Publication status	Published - Oct 2020

User-Defined Keywords

Fracture
Grain boundaries
Halide perovskites
Scanning electron microscope
Thin films

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1016/j.scriptamat.2020.05.062

Cite this

@article{16aad6dc06ac48ee9eb76d5d3f80645a,

title = "Electron-beam-induced cracking in organic-inorganic halide Perovskite thin films",

abstract = "The curious phenomenon of cracking in organic-inorganic halide perovskite (OIHP) thin films for solar cells during scanning electron microscopy (SEM) can be seen in literally thousands of published SEM micrographs. Here we demonstrate, for the first time, the mechanisms responsible for this e-beam-induced damage in OIHP thin films, which is precluding their detailed SEM-characterization and understanding. The e-beam-induced rapid volatilization of the organic species from the OIHP surface in the SEM results in localized shrinkage and buildup of tensile stresses. These stresses drive grain-boundaries cracking, resulting in a {\textquoteleft}mud-cracking{\textquoteright} pattern that is influenced by the thin-film grain size.",

keywords = "Fracture, Grain boundaries, Halide perovskites, Scanning electron microscope, Thin films",

author = "Yadavalli, {Srinivas K.} and Min Chen and Mingyu Hu and Zhenghong Dai and Yuanyuan Zhou and Padture, {Nitin P.}",

note = "Funding Information: The financial support for this research from the Office of Naval Research (grant#s N00014-17-1-2232 and N00014-20-1-2574 ) and the National Science Foundation (grant# OIA-1538893 ) is gratefully acknowledged. ",

year = "2020",

month = oct,

doi = "10.1016/j.scriptamat.2020.05.062",

language = "English",

volume = "187",

pages = "88--92",

journal = "Scripta Materialia",

issn = "1359-6462",

publisher = "Elsevier Ltd.",

}

TY - JOUR

T1 - Electron-beam-induced cracking in organic-inorganic halide Perovskite thin films

AU - Yadavalli, Srinivas K.

AU - Chen, Min

AU - Hu, Mingyu

AU - Dai, Zhenghong

AU - Zhou, Yuanyuan

AU - Padture, Nitin P.

N1 - Funding Information: The financial support for this research from the Office of Naval Research (grant#s N00014-17-1-2232 and N00014-20-1-2574 ) and the National Science Foundation (grant# OIA-1538893 ) is gratefully acknowledged.

PY - 2020/10

Y1 - 2020/10

N2 - The curious phenomenon of cracking in organic-inorganic halide perovskite (OIHP) thin films for solar cells during scanning electron microscopy (SEM) can be seen in literally thousands of published SEM micrographs. Here we demonstrate, for the first time, the mechanisms responsible for this e-beam-induced damage in OIHP thin films, which is precluding their detailed SEM-characterization and understanding. The e-beam-induced rapid volatilization of the organic species from the OIHP surface in the SEM results in localized shrinkage and buildup of tensile stresses. These stresses drive grain-boundaries cracking, resulting in a ‘mud-cracking’ pattern that is influenced by the thin-film grain size.

AB - The curious phenomenon of cracking in organic-inorganic halide perovskite (OIHP) thin films for solar cells during scanning electron microscopy (SEM) can be seen in literally thousands of published SEM micrographs. Here we demonstrate, for the first time, the mechanisms responsible for this e-beam-induced damage in OIHP thin films, which is precluding their detailed SEM-characterization and understanding. The e-beam-induced rapid volatilization of the organic species from the OIHP surface in the SEM results in localized shrinkage and buildup of tensile stresses. These stresses drive grain-boundaries cracking, resulting in a ‘mud-cracking’ pattern that is influenced by the thin-film grain size.

KW - Fracture

KW - Grain boundaries

KW - Halide perovskites

KW - Scanning electron microscope

KW - Thin films

UR - http://www.scopus.com/inward/record.url?scp=85086501659&partnerID=8YFLogxK

U2 - 10.1016/j.scriptamat.2020.05.062

DO - 10.1016/j.scriptamat.2020.05.062

M3 - Journal article

AN - SCOPUS:85086501659

SN - 1359-6462

VL - 187

SP - 88

EP - 92

JO - Scripta Materialia

JF - Scripta Materialia

ER -

Electron-beam-induced cracking in organic-inorganic halide Perovskite thin films

Abstract

User-Defined Keywords

UN SDGs

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