Dependence of the emission from tris (8-hydroxyquinoline) aluminum based microcavity on device thickness and the emission layer position

C. H. Cheung; A. B. Djurišić; C. Y. Kwong; J. Chan; A. D. Rakić; Hoi Lam TAM; Kok Wai CHEAH; Z. T. Liu; W. K. Chan; P. C. Chui

doi:10.1016/j.tsf.2005.04.106

Dependence of the emission from tris (8-hydroxyquinoline) aluminum based microcavity on device thickness and the emission layer position

C. H. Cheung, A. B. Djurišić^*, C. Y. Kwong, J. Chan, A. D. Rakić, Hoi Lam TAM, Kok Wai CHEAH, Z. T. Liu, W. K. Chan, P. C. Chui

^*Corresponding author for this work

Department of Physics

Research output: Contribution to journal › Journal article › peer-review

6 Citations (Scopus)

Abstract

In this work, we present a systematic study of the emission from bilayer organic microcavity light emitting diodes with two metal mirrors. The devices consisting of two organic layers, N,N′-di(naphthalene-1-yl)-N,N′- diphenylbenzidine as the hole transport layer and tris (8-hydroxyquinoline) aluminum as the emitting layer, and two metal mirrors were fabricated and characterized by transmittance, reflectance, photoluminescence, and electroluminescence measurements. The effects of layer thickness, interface position, and the choice of anode (bottom mirror) were investigated. The transmittance and reflectance spectra were modeled using a transfer matrix model, and the optical functions for all the materials used were determined by spectroscopic ellipsometry. The dependence of the photoluminescence and electroluminescence spectra on the device thickness and interface position is discussed.

Original language	English
Pages (from-to)	235-244
Number of pages	10
Journal	Thin Solid Films
Volume	489
Issue number	1-2
DOIs	https://doi.org/10.1016/j.tsf.2005.04.106
Publication status	Published - 1 Oct 2005

Scopus Subject Areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

User-Defined Keywords

Electroluminescence
Evaporation
Organic light emitting diode

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10.1016/j.tsf.2005.04.106

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@article{79b4ac1ce8e74240a235b62d035ac8e2,

title = "Dependence of the emission from tris (8-hydroxyquinoline) aluminum based microcavity on device thickness and the emission layer position",

abstract = "In this work, we present a systematic study of the emission from bilayer organic microcavity light emitting diodes with two metal mirrors. The devices consisting of two organic layers, N,N′-di(naphthalene-1-yl)-N,N′- diphenylbenzidine as the hole transport layer and tris (8-hydroxyquinoline) aluminum as the emitting layer, and two metal mirrors were fabricated and characterized by transmittance, reflectance, photoluminescence, and electroluminescence measurements. The effects of layer thickness, interface position, and the choice of anode (bottom mirror) were investigated. The transmittance and reflectance spectra were modeled using a transfer matrix model, and the optical functions for all the materials used were determined by spectroscopic ellipsometry. The dependence of the photoluminescence and electroluminescence spectra on the device thickness and interface position is discussed.",

keywords = "Electroluminescence, Evaporation, Organic light emitting diode",

author = "Cheung, {C. H.} and Djuri{\v s}i{\'c}, {A. B.} and Kwong, {C. Y.} and J. Chan and Raki{\'c}, {A. D.} and TAM, {Hoi Lam} and CHEAH, {Kok Wai} and Liu, {Z. T.} and Chan, {W. K.} and Chui, {P. C.}",

note = "Funding Information: This work is supported by The Research Grants Council of the Hong Kong Special Administrative Region (Project No. HKU 7056/02E and HKBU 2051/02P) and the University of Hong Kong University Development Fund Grant. The authors would like to thank Dr. J. Gao for the use of step-profiler to verify the device thickness.",

year = "2005",

month = oct,

day = "1",

doi = "10.1016/j.tsf.2005.04.106",

language = "English",

volume = "489",

pages = "235--244",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - Dependence of the emission from tris (8-hydroxyquinoline) aluminum based microcavity on device thickness and the emission layer position

AU - Cheung, C. H.

AU - Djurišić, A. B.

AU - Kwong, C. Y.

AU - Chan, J.

AU - Rakić, A. D.

AU - TAM, Hoi Lam

AU - CHEAH, Kok Wai

AU - Liu, Z. T.

AU - Chan, W. K.

AU - Chui, P. C.

N1 - Funding Information: This work is supported by The Research Grants Council of the Hong Kong Special Administrative Region (Project No. HKU 7056/02E and HKBU 2051/02P) and the University of Hong Kong University Development Fund Grant. The authors would like to thank Dr. J. Gao for the use of step-profiler to verify the device thickness.

PY - 2005/10/1

Y1 - 2005/10/1

N2 - In this work, we present a systematic study of the emission from bilayer organic microcavity light emitting diodes with two metal mirrors. The devices consisting of two organic layers, N,N′-di(naphthalene-1-yl)-N,N′- diphenylbenzidine as the hole transport layer and tris (8-hydroxyquinoline) aluminum as the emitting layer, and two metal mirrors were fabricated and characterized by transmittance, reflectance, photoluminescence, and electroluminescence measurements. The effects of layer thickness, interface position, and the choice of anode (bottom mirror) were investigated. The transmittance and reflectance spectra were modeled using a transfer matrix model, and the optical functions for all the materials used were determined by spectroscopic ellipsometry. The dependence of the photoluminescence and electroluminescence spectra on the device thickness and interface position is discussed.

AB - In this work, we present a systematic study of the emission from bilayer organic microcavity light emitting diodes with two metal mirrors. The devices consisting of two organic layers, N,N′-di(naphthalene-1-yl)-N,N′- diphenylbenzidine as the hole transport layer and tris (8-hydroxyquinoline) aluminum as the emitting layer, and two metal mirrors were fabricated and characterized by transmittance, reflectance, photoluminescence, and electroluminescence measurements. The effects of layer thickness, interface position, and the choice of anode (bottom mirror) were investigated. The transmittance and reflectance spectra were modeled using a transfer matrix model, and the optical functions for all the materials used were determined by spectroscopic ellipsometry. The dependence of the photoluminescence and electroluminescence spectra on the device thickness and interface position is discussed.

KW - Electroluminescence

KW - Evaporation

KW - Organic light emitting diode

UR - http://www.scopus.com/inward/record.url?scp=23144437008&partnerID=8YFLogxK

U2 - 10.1016/j.tsf.2005.04.106

DO - 10.1016/j.tsf.2005.04.106

M3 - Journal article

AN - SCOPUS:23144437008

SN - 0040-6090

VL - 489

SP - 235

EP - 244

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1-2

ER -

Dependence of the emission from tris (8-hydroxyquinoline) aluminum based microcavity on device thickness and the emission layer position

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