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Defect emissions in ZnO nanostructures
A. B. Djurišić*, Y. H. Leung, K. H. Tam, Y. F. Hsu, L. Ding, W. K. Ge, Y. C. Zhong, K. S. Wong, W. K. Chan, Hoi Lam TAM, Kok Wai CHEAH, W. M. Kwok, D. L. Phillips
*Corresponding author for this work
Research output: Contribution to journal › Journal article › peer-review
685
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(Scopus)