Defect detection on patterned jacquard fabric

H. Y.T. Ngan; G. K.H. Pang; S. P. Yung; M. K. Ng

doi:10.1109/AIPR.2003.1284266

Defect detection on patterned jacquard fabric

H. Y.T. Ngan, G. K.H. Pang, S. P. Yung, M. K. Ng

Department of Mathematics

Research output: Chapter in book/report/conference proceeding › Conference proceeding › peer-review

28 Citations (Scopus)

Abstract

The techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on patterned fabrics. A review on some defect detection methods on patterned fabrics is given. Then, a new method for patterned fabric inspection called Golden Image Subtraction (GIS) is introduced. GIS is an efficient and fast method, which can segment out the defective regions on patterned fabric effectively. An improved version of the GIS method using wavelet transform is also given. This research results contribute to the development of an automated fabric inspection machine for the textile industry.

Original language	English
Title of host publication	Proceedings - 32nd Applied Imagery Pattern Recognition Workshop
Subtitle of host publication	Image Data Fusion, AIPR 2003
Publisher	IEEE
Pages	163-168
Number of pages	6
ISBN (Electronic)	0769520294
DOIs	https://doi.org/10.1109/AIPR.2003.1284266
Publication status	Published - Oct 2003
Event	32nd Applied Imagery Pattern Recognition Workshop, AIPR 2003 - Washington, United States Duration: 15 Oct 2003 → 17 Oct 2003 https://ieeexplore.ieee.org/xpl/conhome/9032/proceeding (conference proceeding)

Publication series

Name	Proceedings - Applied Imagery Pattern Recognition Workshop
Volume	2003-January
ISSN (Print)	2164-2516

Conference

Conference	32nd Applied Imagery Pattern Recognition Workshop, AIPR 2003
Country/Territory	United States
City	Washington
Period	15/10/03 → 17/10/03
Internet address	https://ieeexplore.ieee.org/xpl/conhome/9032/proceeding (conference proceeding)

Scopus Subject Areas

General Engineering

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1109/AIPR.2003.1284266

Cite this

@inproceedings{26effe780c72476e9923b33c9336f449,

title = "Defect detection on patterned jacquard fabric",

abstract = "The techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on patterned fabrics. A review on some defect detection methods on patterned fabrics is given. Then, a new method for patterned fabric inspection called Golden Image Subtraction (GIS) is introduced. GIS is an efficient and fast method, which can segment out the defective regions on patterned fabric effectively. An improved version of the GIS method using wavelet transform is also given. This research results contribute to the development of an automated fabric inspection machine for the textile industry.",

author = "Ngan, {H. Y.T.} and Pang, {G. K.H.} and Yung, {S. P.} and Ng, {M. K.}",

note = "S.P. Yung{\textquoteright}s Research supported in part by a CRCG Grant 25500/301/01 and Michael K. Ng's Research supported in part by Hong Kong Research Grants Council Grant Nos. HKU 7130/02P and 7046/03P, and HKU CRCG Grant Nos. 10203501, 10203907 and 10204437. Publisher Copyright: {\textcopyright} 2004 IEEE.; 32nd Applied Imagery Pattern Recognition Workshop, AIPR 2003 ; Conference date: 15-10-2003 Through 17-10-2003",

year = "2003",

month = oct,

doi = "10.1109/AIPR.2003.1284266",

language = "English",

series = "Proceedings - Applied Imagery Pattern Recognition Workshop",

publisher = "IEEE",

pages = "163--168",

booktitle = "Proceedings - 32nd Applied Imagery Pattern Recognition Workshop",

address = "United States",

url = "https://ieeexplore.ieee.org/xpl/conhome/9032/proceeding",

}

Ngan, HYT, Pang, GKH, Yung, SP & Ng, MK 2003, Defect detection on patterned jacquard fabric. in Proceedings - 32nd Applied Imagery Pattern Recognition Workshop: Image Data Fusion, AIPR 2003. Proceedings - Applied Imagery Pattern Recognition Workshop, vol. 2003-January, IEEE, pp. 163-168, 32nd Applied Imagery Pattern Recognition Workshop, AIPR 2003, Washington, United States, 15/10/03. https://doi.org/10.1109/AIPR.2003.1284266

Defect detection on patterned jacquard fabric. / Ngan, H. Y.T.; Pang, G. K.H.; Yung, S. P. et al.
Proceedings - 32nd Applied Imagery Pattern Recognition Workshop: Image Data Fusion, AIPR 2003. IEEE, 2003. p. 163-168 (Proceedings - Applied Imagery Pattern Recognition Workshop; Vol. 2003-January).

Research output: Chapter in book/report/conference proceeding › Conference proceeding › peer-review

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AU - Ngan, H. Y.T.

AU - Pang, G. K.H.

AU - Yung, S. P.

AU - Ng, M. K.

N1 - S.P. Yung’s Research supported in part by a CRCG Grant 25500/301/01 and Michael K. Ng's Research supported in part by Hong Kong Research Grants Council Grant Nos. HKU 7130/02P and 7046/03P, and HKU CRCG Grant Nos. 10203501, 10203907 and 10204437. Publisher Copyright: © 2004 IEEE.

PY - 2003/10

Y1 - 2003/10

N2 - The techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on patterned fabrics. A review on some defect detection methods on patterned fabrics is given. Then, a new method for patterned fabric inspection called Golden Image Subtraction (GIS) is introduced. GIS is an efficient and fast method, which can segment out the defective regions on patterned fabric effectively. An improved version of the GIS method using wavelet transform is also given. This research results contribute to the development of an automated fabric inspection machine for the textile industry.

AB - The techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on patterned fabrics. A review on some defect detection methods on patterned fabrics is given. Then, a new method for patterned fabric inspection called Golden Image Subtraction (GIS) is introduced. GIS is an efficient and fast method, which can segment out the defective regions on patterned fabric effectively. An improved version of the GIS method using wavelet transform is also given. This research results contribute to the development of an automated fabric inspection machine for the textile industry.

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Defect detection on patterned jacquard fabric

Abstract

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Conference

Scopus Subject Areas

UN SDGs

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