TY - JOUR
T1 - Deep Learning Approach for Microwave Imaging in Broad Frequency Band Based on Physics-Driven Loss and Deep Convolutional V-Net Structure
AU - Guo, Xingyue
AU - Yao, He Ming
AU - Liu, Yuan’an
AU - Ng, Michael
AU - Song, Shiji
N1 - This work was supported in part by the Major Research Project on Scientific Instrument Development, National Natural Science Foundation of China (NSFC) under Grant 42327901; in part by the NSFC Projects under Grant 62301071 and Grant 62293491; in part by Hong Kong Research Grant Council General Research Fund (RGC) under Grant 17300021, Grant C1013-21GF, and Grant C7004-21GF; and in part by the Joint NSFC-Research Grants Council (RGC) under Grant N- HKU76921.
Publisher Copyright:
© 2025 IEEE
PY - 2025/6/11
Y1 - 2025/6/11
N2 - This article proposes a novel deep learning (DL) approach to realize quantitative real-time microwave imaging (MWI) in the extremely broad frequency band. The proposed DL approach is based on the deep convolutional V-net structure, which employs the residual block and deep convolutional operation to improve its generality and performance. To integrate the physics-based prior to DL model, the inverse-forward closed-loop training framework is introduced to compute the training loss, which comprises two fundamental components: 1) the inverse process for computing data-driven loss, which directly quantifies the dissimilarity between the predictions of our proposed V-net and the actual target contrasts and 2) the forward process for computing physics-driven loss, which evaluates the distinctions between the input EM scattered field and the computed EM scattered field derived from the prediction of V-net. Consequently, the proposed DL method can work with excellent accuracy even for heterogeneous and high-contrast targets, only requiring the single-frequency far-field-measured EM scattered field at the arbitrary frequency in the extremely broad frequency band. Moreover, the proposed DL method can present satisfactory robust on the extremely broad frequency band and provide nearly the same excellent inversion performance on totally different frequencies for one target scatterer. Numerical benchmarks illustrate the feasibility of this proposed DL method.
AB - This article proposes a novel deep learning (DL) approach to realize quantitative real-time microwave imaging (MWI) in the extremely broad frequency band. The proposed DL approach is based on the deep convolutional V-net structure, which employs the residual block and deep convolutional operation to improve its generality and performance. To integrate the physics-based prior to DL model, the inverse-forward closed-loop training framework is introduced to compute the training loss, which comprises two fundamental components: 1) the inverse process for computing data-driven loss, which directly quantifies the dissimilarity between the predictions of our proposed V-net and the actual target contrasts and 2) the forward process for computing physics-driven loss, which evaluates the distinctions between the input EM scattered field and the computed EM scattered field derived from the prediction of V-net. Consequently, the proposed DL method can work with excellent accuracy even for heterogeneous and high-contrast targets, only requiring the single-frequency far-field-measured EM scattered field at the arbitrary frequency in the extremely broad frequency band. Moreover, the proposed DL method can present satisfactory robust on the extremely broad frequency band and provide nearly the same excellent inversion performance on totally different frequencies for one target scatterer. Numerical benchmarks illustrate the feasibility of this proposed DL method.
KW - Broad band
KW - V-net
KW - convolutional neural network
KW - deep learning (DL)
KW - high contrast
KW - microwave imaging (MWI)
UR - http://www.scopus.com/inward/record.url?scp=105008131709&partnerID=8YFLogxK
U2 - 10.1109/LMWT.2025.3575160
DO - 10.1109/LMWT.2025.3575160
M3 - Journal article
SN - 2771-957X
JO - IEEE Microwave and Wireless Technology Letters
JF - IEEE Microwave and Wireless Technology Letters
ER -