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Current calculation on VLSI signal interconnects
Muzhou Shao
, Youxin Gao
, Li Pen Yuan
, Hung Ming Chen
,
Martin DF Wong
Office of the Provost
Research output
:
Chapter in book/report/conference proceeding
›
Conference proceeding
›
peer-review
9
Citations (Scopus)
Overview
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Dive into the research topics of 'Current calculation on VLSI signal interconnects'. Together they form a unique fingerprint.
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Keyphrases
Current Calculation
100%
Electromigration
40%
Reliability Verification
40%
Nanometer Size
20%
Peak Current
20%
Effective Solutions
20%
Input Signals
20%
Pruning Strategy
20%
Downscaling
20%
Calculation Method
20%
Working Frequency
20%
Deep Submicron
20%
VLSI Design
20%
Post-layout
20%
Technology Scaling
20%
SoC Design
20%
Comprehensive Reliability
20%
Average Current
20%
RMS Current
20%
Ramp Input
20%
Resistor Model
20%
IC Design
20%
Calculation Technique
20%
Reliability Validation
20%
Circuit Simulator
20%
Full-chip
20%
Static Current
20%
Gating Model
20%
IC Technology
20%
Time-domain Circuits
20%
Dynamic Current
20%
Step Input
20%
Chip Verification
20%
Computer Science
Experimental Result
100%
Effective Solution
100%
System-on-Chip
100%
Domain Circuit
100%
Engineering
Interconnects
100%
Electromigration
50%
Experimental Result
25%
Nanometre
25%
Effective Solution
25%
Input Signal
25%
Integrated Circuit Design
25%
System-on-Chip
25%
Time-domain Circuit
25%
Step Input
25%