Current calculation on VLSI signal interconnects

Muzhou Shao, Youxin Gao, Li Pen Yuan, Hung Ming Chen, Martin DF Wong

Research output: Chapter in book/report/conference proceedingConference proceedingpeer-review

8 Citations (Scopus)


With IC technology scaling down to nanometer sizes, the higher working frequency and smaller geometry drive the reliability of signal interconnects to be a critical challenge in VLSI design. Post-layout reliability verification is an effective solution to this challenge. However, the implementation of a full-chip verification on signal electromigration requires a huge number of interconnect current calculations. The dynamic current calculation methods established on time domain circuit simulators are prohibitively expensive of runtime when applied to DSM (deep sub-micron) ICs. We propose an efficient static current calculation technique. A notable characteristic of this technique is that current calculations are based on ramp input signals, a more realistic signal than a step input. Moreover, an advanced gate model is applied to this technique; thus the current it yields is more accurate than that using a switch-resistor model. Since different electromigration models require different types of interconnect current values in their evaluation, this technique can handle the calculation of average, RMS and peak currents in order to perform a comprehensive reliability validation in IC designs. The experimental results demonstrate the efficiency and accuracy of this technique. Combined with a pruning technique, it is integrated into a reliability verification flow to be tested on a SoC design.

Original languageEnglish
Title of host publicationProceedings of 6th International Symposium on Quality Electronic Design, ISQED 2005
Place of PublicationUnited States
Number of pages6
Publication statusPublished - Mar 2005
Event6th International Symposium on Quality Electronic Design, ISQED 2005 - San Jose, United States
Duration: 21 Mar 200523 Mar 2005 (Conference website) (Conference program) (Conference proceedings)

Publication series

NameProceedings of International Symposium on Quality Electronic Design, ISQED
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295


Symposium6th International Symposium on Quality Electronic Design, ISQED 2005
Country/TerritoryUnited States
CitySan Jose
Internet address

Scopus Subject Areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality


Dive into the research topics of 'Current calculation on VLSI signal interconnects'. Together they form a unique fingerprint.

Cite this