TY - JOUR
T1 - BadLabel
T2 - A Robust Perspective on Evaluating and Enhancing Label-Noise Learning
AU - Zhang, Jingfeng
AU - Song, Bo
AU - Wang, Haohan
AU - Han, Bo
AU - Liu, Tongliang
AU - Liu, Lei
AU - Sugiyama, Masashi
N1 - The work of Lei Liu was supported in part by the National Natural Science Foundation of China under Grant 62220106004, in part by the Natural Science Foundation of Shandong under Grant ZR2021LZH006, and in part by Taishan Scholars Program. The work of Bo Han was supported in part by the RGC Early Career Scheme under Grant 22200720, in part by the NSFC General Program under Grant 62376235, in part by Guangdong Basic and Applied Basic Research Foundation under Grant 2022A1515011652, in part by HKBU Faculty Niche Research Areas under Grant RC-FNRA-IG/22-23/SCI/04, and in part by HKBU CSD Departmental Incentive Scheme. The work of Tongliang Liu was supported by the following Australian Research Council projects under Grants FT220100318, DP220102121, LP220100527, LP220200949, and IC190100031.
Publisher Copyright:
© 2024 IEEE.
PY - 2024/6/1
Y1 - 2024/6/1
N2 - Label-noise learning (LNL) aims to increase the model's generalization given training data with noisy labels. To facilitate practical LNL algorithms, researchers have proposed different label noise types, ranging from class-conditional to instance-dependent noises. In this paper, we introduce a novel label noise type called BadLabel, which can significantly degrade the performance of existing LNL algorithms by a large margin. BadLabel is crafted based on the label-flipping attack against standard classification, where specific samples are selected and their labels are flipped to other labels so that the loss values of clean and noisy labels become indistinguishable. To address the challenge posed by BadLabel, we further propose a robust LNL method that perturbs the labels in an adversarial manner at each epoch to make the loss values of clean and noisy labels again distinguishable. Once we select a small set of (mostly) clean labeled data, we can apply the techniques of semi-supervised learning to train the model accurately. Empirically, our experimental results demonstrate that existing LNL algorithms are vulnerable to the newly introduced BadLabel noise type, while our proposed robust LNL method can effectively improve the generalization performance of the model under various types of label noise. The new dataset of noisy labels and the source codes of robust LNL algorithms are available at https://github.com/zjfheart/BadLabels.
AB - Label-noise learning (LNL) aims to increase the model's generalization given training data with noisy labels. To facilitate practical LNL algorithms, researchers have proposed different label noise types, ranging from class-conditional to instance-dependent noises. In this paper, we introduce a novel label noise type called BadLabel, which can significantly degrade the performance of existing LNL algorithms by a large margin. BadLabel is crafted based on the label-flipping attack against standard classification, where specific samples are selected and their labels are flipped to other labels so that the loss values of clean and noisy labels become indistinguishable. To address the challenge posed by BadLabel, we further propose a robust LNL method that perturbs the labels in an adversarial manner at each epoch to make the loss values of clean and noisy labels again distinguishable. Once we select a small set of (mostly) clean labeled data, we can apply the techniques of semi-supervised learning to train the model accurately. Empirically, our experimental results demonstrate that existing LNL algorithms are vulnerable to the newly introduced BadLabel noise type, while our proposed robust LNL method can effectively improve the generalization performance of the model under various types of label noise. The new dataset of noisy labels and the source codes of robust LNL algorithms are available at https://github.com/zjfheart/BadLabels.
KW - Robust label-noise learning
KW - a challenging type of label noise
UR - https://ieeexplore.ieee.org/document/10404058/
U2 - 10.1109/TPAMI.2024.3355425
DO - 10.1109/TPAMI.2024.3355425
M3 - Journal article
SN - 1939-3539
VL - 46
SP - 4398
EP - 4409
JO - IEEE Transactions on Pattern Analysis and Machine Intelligence
JF - IEEE Transactions on Pattern Analysis and Machine Intelligence
IS - 6
M1 - 10404058
ER -