Application of admittance spectroscopy to evaluate carrier mobility in organic charge transport materials

S. W. Tsang, S. K. So*, J. B. Xu

*Corresponding author for this work

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232 Citations (Scopus)
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Abstract

We examine the feasibility of admittance spectroscopy (AS) and susceptance analysis in the determination of the charge-carrier mobility in an organic material. The complex admittance of the material is analyzed as a function of frequency in AS. We found that the susceptance, which is the imaginary part of the complex admittance, is related to the carrier transport properties of the materials. A plot of the computer-simulated negative differential susceptance versus frequency yields a maximum at a frequency τr -1. The position of the maximum τr -1 is related to the average carrier transit time τdc by τdc =0.56 τr. Thus, knowledge of τr can be used to determine the carrier mobility in the material. Devices with the structure ITO/4, 4′, 4″ -tris [N, -(3-methylphenyl)- N -phenylamino] triphenylamine/Ag have been designed to investigate the validity of the susceptance analysis in the hole mobility determination. The hole mobilities were measured both as functions of the electric field and the temperature. The hole mobility data extracted by susceptance analysis were in excellent agreement with those independently obtained from time-of-flight (TOF) measurements. Using the temperature dependence results, we further analyzed the mobility data by the Gaussian disorder model (GDM). The GDM disorder parameters are also in good agreement with those determined from TOF.

This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in S. W. Tsang, S. K. So, J. B. Xu; Application of admittance spectroscopy to evaluate carrier mobility in organic charge transport materials. J. Appl. Phys. 1 January 2006; 99 (1): 013706. https://doi.org/10.1063/1.2158494 and may be found at https://pubs.aip.org/aip/jap/article/99/1/013706/922938/Application-of-admittance-spectroscopy-to-evaluate.

Original languageEnglish
Article number013706
Number of pages7
JournalJournal of Applied Physics
Volume99
Issue number1
DOIs
Publication statusPublished - Jan 2006

Scopus Subject Areas

  • Physics and Astronomy(all)

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