An efficient linear time triple patterning solver

Haitong Tian, Hongbo Zhang, Zigang Xiao, Martin D.F. Wong

Research output: Chapter in book/report/conference proceedingConference proceedingpeer-review

7 Citations (Scopus)

Abstract

Triple patterning lithography (TPL) has been recognized as one of the most promising techniques for 14/10nm technology node. In this paper, we applied triple patterning lithography on standard cell based designs, and proposed a novel algorithm to solve the problem. The algorithm guarantees to find a legal TPL decomposition with optimal number of stitches if one exists. A graph model is proposed to reduce the number of vertices in the solution graph, and a fast approach is developed to achieve simultaneous runtime and memory improvement. An efficient approach to limit the number of stitches is also proposed, which greatly reduces the total number of stitch candidates and enables an incremental implementation of the algorithm. Experimental results shows that the proposed algorithm is very efficient, which achieves 39.1% runtime improvement and 18.4% memory reduction compared with the state-of-the-art TPL algorithm on the same problem.
Original languageEnglish
Title of host publicationThe 20th Asia and South Pacific Design Automation Conference
PublisherIEEE
Pages208-213
Number of pages6
ISBN (Electronic)9781479977925, 9781479977901 (CD)
DOIs
Publication statusPublished - Jan 2015
EventThe 20th Asia and South Pacific Design Automation Conference - Chiba, Japan
Duration: 19 Jan 201522 Jan 2015
https://ieeexplore.ieee.org/xpl/conhome/7050531/proceeding (Link to conference proceedings)

Publication series

NameProceedings of Asia and South Pacific Design Automation Conference

Conference

ConferenceThe 20th Asia and South Pacific Design Automation Conference
Country/TerritoryJapan
CityChiba
Period19/01/1522/01/15
Internet address

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