Accurate determination of the index of refraction of polymer blend films by spectroscopic ellipsometry

Keyphrases

• Index of Refraction 100%
• Accurate Determination 100%
• Polymer Blend Film 100%
• Spectroscopic Ellipsometry 100%
• Phenyl 66%
• Butyric Acid 66%
• Poly(3-hexylthiophene) (P3HT) 66%
• Optical Functions 66%
• Proposed Methodology 33%
• Unique Solution 33%
• Methyl Ester 33%
• Bulk Heterojunction Solar Cells 33%
• Organic Photovoltaics 33%
• Blend Film 33%
• Material System 33%
• Surface Characterization 33%
• Surface Roughness 33%
• Multi-sample Analysis 33%
• Anisotropy 33%
• Multiple Solutions 33%
• Non-ideal Model 33%
• Methyl Ester Blends 33%
• Cauchy Model 33%
• Thickness Measurement 33%
• Ellipsometry Measurement 33%
• Thickness Characterization 33%
• Graded Layer 33%

Material Science

• Film 100%
• Polymer Blend 100%
• Organic Solar Cells 33%
• Bulk Heterojunction Solar Cell 33%
• Anisotropy 33%
• Surface Characterization 33%
• Surface Roughness 33%