Abstract
Inverse lithography technology (ILT) is one of the promising resolution enhancement techniques (RETs) in modern design-for-manufacturing closure, however, it suffers from huge computational overhead and unaffordable mask writing time. In this paper, we propose A2-ILT, a GPU-accelerated ILT framework with spatial attention mechanism. Based on the previous GPU-accelerated ILT flow, we significantly improve the ILT quality by introducing spatial attention map and on-the-fly mask rectilinearization, and strengthen the robustness by Reinforcement-Learning deployment. Experimental results show that, comparing to the state-of-the-art solutions, A2-ILT achieves 5.06% and 11.60% reduction in printing error and process variation band with a lower mask complexity and superior runtime performance.
| Original language | English |
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| Title of host publication | 59th ACM/IEEE Design Automation Conference - Proceedings 2022 |
| Publisher | Association for Computing Machinery (ACM) |
| Pages | 967-972 |
| Number of pages | 6 |
| ISBN (Print) | 9781450391429 |
| DOIs | |
| Publication status | Published - 14 Jul 2022 |
| Event | 59th ACM/IEEE Design Automation Conference, DAC 2022 - San Francisco, United States Duration: 10 Jul 2022 → 14 Jul 2022 https://www.dac.com/About/Conference-Archive/59th-DAC-2022 (Conference website) https://www.dac.com/Portals/0/DAC%2059/59DAC%20Onsite%20Guide_v3.pdf?ver=GbBS5sBuhmEVJWVEz9CNIg%3d%3d (Conference programme) https://dl.acm.org/doi/proceedings/10.1145/3489517 (Conference proceedings) |
Publication series
| Name | ACM/IEEE Design Automation Conference - Proceedings |
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| ISSN (Print) | 0738-100X |
Conference
| Conference | 59th ACM/IEEE Design Automation Conference, DAC 2022 |
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| Country/Territory | United States |
| City | San Francisco |
| Period | 10/07/22 → 14/07/22 |
| Internet address |
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