Abstract
Antenna problem is a phenomenon of plasma induced gate oxide degradation. It directly affects manufacturability of VLSI circuits, especially in deep-submicron technology using high density plasma. Diode insertion is a very effective way to solve this problem Ideally diodes are inserted directly under the wires that violate antenna rules. But in today's high-density VLSI layouts, there is simply not enough room for "under-the-wire" diode insertion for all wires. Thus it is necessary to insert many diodes at legal "off-wire" locations and extend the antenna-rule violating wires to connect to their respective diodes. Previously only simple heuristic algorithms were available for this diode insertion and routing problem. In this paper we show that the diode insertion and routing problem for an arbitrary given number of routing layers can be optimally solved in polynomial time. Our algorithm guarantees to find a feasible diode insertion and routing solution whenever one exists. Moreover we can guarantee to find a feasible solution to minimize a cost function of the form /spl alpha/ /spl middot/ L + /spl beta/ /spl middot/ N where L is the total length of extension wires and N is the total number of Was on the extension wires. Experimental results show that our algorithm is very efficient.
Original language | English |
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Title of host publication | Proceedings of the Design, Automation and Test in Europe Conference and Exhibition, DATE 2002 |
Editors | Carlos Delgado Kloos, Jose da Franca |
Place of Publication | United States |
Publisher | IEEE |
Pages | 470-475 |
Number of pages | 6 |
DOIs | |
Publication status | Published - Mar 2002 |
Event | 2002 Design, Automation and Test in Europe Conference and Exhibition, DATE 2002 - Le Palais des Congrès, Paris, France Duration: 4 Mar 2002 → 8 Mar 2002 https://past.date-conference.com/proceedings-archive/2002/YEAR.HTM (Conference proceedings) |
Publication series
Name | Proceedings of Design, Automation and Test in Europe Conference and Exhibition, DATE |
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ISSN (Print) | 1530-1591 |
Conference
Conference | 2002 Design, Automation and Test in Europe Conference and Exhibition, DATE 2002 |
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Country/Territory | France |
City | Paris |
Period | 4/03/02 → 8/03/02 |
Internet address |
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