A More Precise Model of Noise Based PCMOS Errors

Arun Bhanu; Mark S.K. Lau; Keck Voon Ling; Vincent J. Mooney; Anshul Singh

doi:10.1109/DELTA.2010.18

A More Precise Model of Noise Based PCMOS Errors

Arun Bhanu
, Mark S.K. Lau
, Keck Voon Ling
, Vincent J. Mooney
, Anshul Singh

Department of Mathematics

Research output: Chapter in book/report/conference proceeding › Conference proceeding › peer-review

14 Citations (Scopus)

Abstract

In this paper we present a new model for characterization of probabilistic gates. While still not mainstream, probabilistic CMOS has the potential to dramatically reduce energy consumption by trading off with error rates on individual bits, e.g., least significant bits of an adder. Our contribution helps account for the filtering effect seen in noise based PCMOS in a novel way. The characterization proposed here can enable accurate multi-bit models based on fast mathematical extrapolation instead of expensive and slow HSPICE simulations.

Original language	English
Title of host publication	Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010
Publisher	IEEE
Pages	99-102
Number of pages	4
ISBN (Electronic)	9781424460267
ISBN (Print)	9781424460250, 9780769539782
DOIs	https://doi.org/10.1109/DELTA.2010.18
Publication status	Published - 13 Jan 2010
Event	5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010 - Ho Chi Minh City, Viet Nam Duration: 13 Jan 2010 → 15 Jan 2010 https://ieeexplore.ieee.org/xpl/conhome/5438527/proceeding (Conference Proceedings)

Publication series

Name	Proceedings - IEEE International Symposium on Electronic Design, Test and Applications, DELTA

Conference

Conference	5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010
Country/Territory	Viet Nam
City	Ho Chi Minh City
Period	13/01/10 → 15/01/10
Internet address	https://ieeexplore.ieee.org/xpl/conhome/5438527/proceeding (Conference Proceedings)

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy

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10.1109/DELTA.2010.18

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Bhanu, A., Lau, M. S. K., Ling, K. V., Mooney, V. J., & Singh, A. (2010). A More Precise Model of Noise Based PCMOS Errors. In Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010 (pp. 99-102). (Proceedings - IEEE International Symposium on Electronic Design, Test and Applications, DELTA). IEEE. https://doi.org/10.1109/DELTA.2010.18

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title = "A More Precise Model of Noise Based PCMOS Errors",

abstract = "In this paper we present a new model for characterization of probabilistic gates. While still not mainstream, probabilistic CMOS has the potential to dramatically reduce energy consumption by trading off with error rates on individual bits, e.g., least significant bits of an adder. Our contribution helps account for the filtering effect seen in noise based PCMOS in a novel way. The characterization proposed here can enable accurate multi-bit models based on fast mathematical extrapolation instead of expensive and slow HSPICE simulations.",

author = "Arun Bhanu and Lau, \{Mark S.K.\} and Ling, \{Keck Voon\} and Mooney, \{Vincent J.\} and Anshul Singh",

note = "Publisher Copyright: {\textcopyright} 2010 IEEE. Funding Information: This work was supported by the Institute for Sustainable Nanoelectronics, Nanyang Technological University (Project Ref: M58B30001).; 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010 ; Conference date: 13-01-2010 Through 15-01-2010",

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day = "13",

doi = "10.1109/DELTA.2010.18",

language = "English",

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series = "Proceedings - IEEE International Symposium on Electronic Design, Test and Applications, DELTA",

publisher = "IEEE",

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booktitle = "Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010",

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Bhanu, A, Lau, MSK, Ling, KV, Mooney, VJ & Singh, A 2010, A More Precise Model of Noise Based PCMOS Errors. in Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010. Proceedings - IEEE International Symposium on Electronic Design, Test and Applications, DELTA, IEEE, pp. 99-102, 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010, Ho Chi Minh City, Viet Nam, 13/01/10. https://doi.org/10.1109/DELTA.2010.18

A More Precise Model of Noise Based PCMOS Errors. / Bhanu, Arun; Lau, Mark S.K.; Ling, Keck Voon et al.
Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010. IEEE, 2010. p. 99-102 (Proceedings - IEEE International Symposium on Electronic Design, Test and Applications, DELTA).

Research output: Chapter in book/report/conference proceeding › Conference proceeding › peer-review

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AU - Singh, Anshul

PY - 2010/1/13

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ER -

A More Precise Model of Noise Based PCMOS Errors

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