TY - GEN
T1 - A lip contour extraction method using localized active contour model with automatic parameter selection
AU - Liu, Xin
AU - CHEUNG, Yiu Ming
AU - Li, Meng
AU - Liu, Hailin
N1 - Copyright:
Copyright 2010 Elsevier B.V., All rights reserved.
PY - 2010
Y1 - 2010
N2 - Lip contour extraction is crucial to the success of a lipreading system. This paper presents a lip contour extraction algorithm using localized active contour model with the automatic selection of proper parameters. The proposed approach utilizes a minimum-bounding ellipse as the initial evolving curve to split the local neighborhoods into the local interior region and the local exterior region, respectively, and then compute the localized energy for evolving and extracting. This method is robust against the uneven illumination, rotation, deformation, and the effects of teeth and tongue. Experiments show its promising result in comparison with the existing methods.
AB - Lip contour extraction is crucial to the success of a lipreading system. This paper presents a lip contour extraction algorithm using localized active contour model with the automatic selection of proper parameters. The proposed approach utilizes a minimum-bounding ellipse as the initial evolving curve to split the local neighborhoods into the local interior region and the local exterior region, respectively, and then compute the localized energy for evolving and extracting. This method is robust against the uneven illumination, rotation, deformation, and the effects of teeth and tongue. Experiments show its promising result in comparison with the existing methods.
KW - Lip contour extraction
KW - Localized active contour model
KW - Localized energy
KW - Minimum-bounding ellipse
UR - http://www.scopus.com/inward/record.url?scp=78149491410&partnerID=8YFLogxK
U2 - 10.1109/ICPR.2010.1053
DO - 10.1109/ICPR.2010.1053
M3 - Conference proceeding
AN - SCOPUS:78149491410
SN - 9780769541099
T3 - Proceedings - International Conference on Pattern Recognition
SP - 4332
EP - 4335
BT - Proceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010
T2 - 2010 20th International Conference on Pattern Recognition, ICPR 2010
Y2 - 23 August 2010 through 26 August 2010
ER -