Abstract
Both In-stabilised (4*2) and P-stabilised (1*4) surface reconstructions of InP(100) have been obtained by using ion sputtering followed with successive phosphorus deposition and annealing. Electron energy loss spectroscopy has been proved to be a sensitive and reliable technique in identifying the existence of surface indium islands as well as the characteristic of the outermost atomic layer. The (1*4) structure is probably a random combination of (2*4) and c(2*8) reconstructions. This suggests that the P-stabilised InP(100) surface prepared by the above treatment is less ordered than the In-stabilised (4*2) structure.
| Original language | English |
|---|---|
| Pages (from-to) | 293-294 |
| Number of pages | 2 |
| Journal | Semiconductor Science and Technology |
| Volume | 1 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - Nov 1986 |
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